Qualification by optical means of CdTe substrates
Triboulet, R., Durand, A., Gall, P., Bonnafé, J., Fillard, J.P., Krawczyk, S.K.
Published in Journal of crystal growth (01.02.1992)
Published in Journal of crystal growth (01.02.1992)
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Conference Proceeding
Towards medical diagnostic chips with monolithically integrated optics in glass substrates
Krawczyk, S. K., Mazurczyk, R., Bouchard, A., Vieillard, J., Hannes, B.
Published in Physica status solidi. C (01.04.2007)
Published in Physica status solidi. C (01.04.2007)
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Growth of InGaAs/InP structures by gas source molecular beam epitaxy on SiO2-patterned substrates for optoelectronic applications
NAGY, S. C, ROBINSON, B. J, THOMPSON, D. A, SIMMONS, J. G, NUBAN, M. F, KRAWCZYK, S. K, BUCHHEIT, M, BLANCHET, R. C
Published in Journal of crystal growth (01.05.1997)
Published in Journal of crystal growth (01.05.1997)
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Inspection of n-type InP crystals by scanning photoluminescence measurements
Krawczyk, S K, Krafft, F, Klingelhofer, C, Garrigues, M, Schohe, K
Published in Semiconductor science and technology (01.01.1992)
Published in Semiconductor science and technology (01.01.1992)
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Chemomechanical Polishing and Etching of GaAs : In and GaAs in Aqueous Solutions of NaOCl
Khoukh, A., Krawczyk, S. K., Olier, R., Chabli, A., Molva, E.
Published in Journal of the Electrochemical Society (01.07.1987)
Published in Journal of the Electrochemical Society (01.07.1987)
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Spatial distribution of donors in silicon implanted iron and iron-gallium doped semi-insulating indium phosphide
Favennec, P.N., L'Haridon, H., Coquillé, R., Salvi, M., Gauneau, M., Roizes, A., David, J.P., Krawczyk, S.K., Longères, J.Y.
Published in Journal of crystal growth (01.06.1990)
Published in Journal of crystal growth (01.06.1990)
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Conference Proceeding
Residual strain mapping in III–V materials by spectrally resolved scanning photoluminescence
Buchheit, M., Khoukh, A., Bejar, M., Krawczyk, S.K., Blanchet, R.C.
Published in Microelectronics (01.07.1999)
Published in Microelectronics (01.07.1999)
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Application of spectrally resolved scanning photoluminescence to assess relaxation processes of InGaAs and InAlAs layers strained in compression and tension
Krawczyk, S.K., Gendry, M., Klingelhöfer, C., Venet, T., Buchheit, M., Blanchet, R., Hollinger, G.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.12.1996)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.12.1996)
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New scanning photoluminescence technique for quantitative mapping the surface recombination velocity in InP and related materials
Krawczyk, S.K., Bejar, M., Blanchet, R.C., Khoukh, A., Sermage, B., Cui, D., Pavlidis, D.
Published in Conference Proceedings. 1998 International Conference on Indium Phosphide and Related Materials (Cat. No.98CH36129) (1998)
Published in Conference Proceedings. 1998 International Conference on Indium Phosphide and Related Materials (Cat. No.98CH36129) (1998)
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Conference Proceeding
Passivation of InP surfaces controlled by photoluminescence measurements
Longère, J.Y., Schohe, K., Krawczyk, S.K., Schütz, R., Hartnagel, H.L.
Published in Applied surface science (01.10.1989)
Published in Applied surface science (01.10.1989)
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New scanning photoluminescence technique for mapping the lifetime and the doping density: application to carbon doped InGaAs/InP layers and heterostructures
Krawczyk, S.K., Bejar, M., Nuban, M.F., Blanchet, R.C., Sermage, B., Benchimol, J.L., Dong, K., Cui, D., Pavlidis, D.
Published in Conference Proceedings. 1997 International Conference on Indium Phosphide and Related Materials (1997)
Published in Conference Proceedings. 1997 International Conference on Indium Phosphide and Related Materials (1997)
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Conference Proceeding
Control of the Fabrication Steps of InP MIS Transistors by Means of Scanning Photoluminescence Measurements
Commere, B., Garrigues, M., Krawczyk, S.K., Lallemand, C., Schohe, K., Canut, B.
Published in ESSDERC '88: 18th European Solid State Device Research Conference (01.09.1988)
Published in ESSDERC '88: 18th European Solid State Device Research Conference (01.09.1988)
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