Side-Wall Measurement using Tilt-Scanning Method in Atomic Force Microscope
Murayama, Ken, Gonda, Satoshi, Koyanagi, Hajime, Terasawa, Tsuneo, Hosaka, Sumio
Published in Japanese Journal of Applied Physics (01.06.2006)
Published in Japanese Journal of Applied Physics (01.06.2006)
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Journal Article
Simultaneous observation of 3-dimensional magnetic stray field and surface structure using new force microscope
HOSAKA, S, KIKUKAWA, A, HONDA, Y, KOYANAGI, H, TANAKA, S
Published in Japanese Journal of Applied Physics (01.07.1992)
Published in Japanese Journal of Applied Physics (01.07.1992)
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Journal Article
Fine pit pattern formation by EB-writing for a high density optical recording
Hosaka, Sumio, Koyanagi, Hajime, Katoh, Keizou, Isshiki, Fumio, Suzuki, Tatsundo, Miyamoto, Mitsuhide, Arimoto, Akira, Maeda, Takeshi
Published in Microelectronic engineering (01.09.2001)
Published in Microelectronic engineering (01.09.2001)
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Conference Proceeding
Study of magnetic stray field measurement on surface using new force microscope
HOSAKA, S, KIKUKAWA, A, HONDA, Y, KOYANAGI, H
Published in Japanese Journal of Applied Physics (01.07.1992)
Published in Japanese Journal of Applied Physics (01.07.1992)
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Journal Article