Special Issue on Reliability
Mahapatra, Souvik, Chen, Kevin J., Kaczer, Ben, Pancheri, Lucio, Rosenbaum, Elyse, Mouli, Chandra, Wong, Hei, Kerber, Andreas, Monzio Compagnoni, Christian, Koval, Randy, Meneghesso, Gaudenzio, Sheridan, David, Ramey, Stephen, Wang, Runsheng, Stathis, Jim
Published in IEEE transactions on electron devices (01.11.2019)
Published in IEEE transactions on electron devices (01.11.2019)
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Journal Article
Resolving discrete emission events: A new perspective for detrapping investigation in NAND Flash memories
Miccoli, C., Barber, J., Compagnoni, C. M., Paolucci, G. M., Kessenich, J., Lacaita, A. L., Spinelli, A. S., Koval, R. J., Goda, A.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
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Conference Proceeding