비정지 대상물을 이미징하기 위한 방법 및 장치
VERSCHUREN COEN ADRIANUS, ZIJP FERRY, PANDEY NITESH, KONIJNENBERG ALEXANDER PRASETYA
Year of Publication 25.07.2023
Get full text
Year of Publication 25.07.2023
Patent
복소-값 필드를 결정하는 계측 방법 및 장치
COENE WILLEM MARIE JULIA MARCEL, PANDEY NITESH, KONIJNENBERG ALEXANDER PRASETYA
Year of Publication 25.01.2022
Get full text
Year of Publication 25.01.2022
Patent
계측 방법 및 장치
KOOLEN ARMAND EUGENE ALBERT, COENE WILLEM MARIE JULIA MARCEL, DEN BOEF ARIE JEFFREY, TUKKER TEUNIS WILLEM, KONIJNENBERG ALEXANDER PRASETYA
Year of Publication 17.05.2024
Get full text
Year of Publication 17.05.2024
Patent
기판 상의 주기적 구조체를 측정하는 메트롤로지 방법 및 디바이스
VAN DE VEN BASTIAAN LAMBERTUS WILHELMUS MARINUS, TENNER VASCO TOMAS, LOMANS BRAM ANTONIUS GERARDUS, CRAMER HUGO AUGUSTINUS JOSEPH, TINNEMANS PATRICIUS ALOYSIUS JACOBUS, WARNAAR PATRICK, KONIJNENBERG ALEXANDER PRASETYA, CUNBUL AHMET BURAK
Year of Publication 02.09.2022
Get full text
Year of Publication 02.09.2022
Patent
METHOD AND APPARATUS FOR IMAGING NONSTATIONARY OBJECT
KONIJNENBERG, Alexander Prasetya, VERSCHUREN, Coen Adrianus, PANDEY, Nitesh, ZIJP, Ferry
Year of Publication 04.01.2024
Get full text
Year of Publication 04.01.2024
Patent
METROLOGY METHOD AND APPARATUS FOR OF DETERMINING A COMPLEX-VALUED FIELD
KONIJNENBERG, Alexander Prasetya, COENE, Willem Marie Julia Marcel, PANDEY, Nitesh
Year of Publication 22.09.2022
Get full text
Year of Publication 22.09.2022
Patent
METHOD AND APPARATUS FOR IMAGING NONSTATIONARY OBJECT
VERSCHUREN, Coen, Adrianus, KONIJNENBERG, Alexander, Prasetya, PANDEY, Nitesh, ZIJP, Ferry
Year of Publication 08.06.2022
Get full text
Year of Publication 08.06.2022
Patent
Metrology method and device
TUKKER Teunis Willem, KONIJNENBERG Alexander Prasetya, COENE Willem Marie Julia Marcel, KOOLEN Armand Eugene Albert, DEN BOEF Arie Jeffrey
Year of Publication 01.04.2024
Get full text
Year of Publication 01.04.2024
Patent
METROLOGY METHOD AND DEVICE
KONIJNENBERG, Alexander Prasetya, COENE, Willem Marie Julia Marcel, KOOLEN, Armand Eugene Albert, DEN BOEF, Arie Jeffrey, TUKKER, Teunis Willem
Year of Publication 24.05.2023
Get full text
Year of Publication 24.05.2023
Patent
METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMETERIZED MODEL
KONIJNENBERG, Alexander Prasetya, PISARENCO, Maxim, MIDDLEBROOKS, Scott Anderson, WARNAAR, Patrick, HELFENSTEIN, Patrick Philipp, VAN KRAAIJ, Markus Gerardus Martinus Maria
Year of Publication 05.01.2023
Get full text
Year of Publication 05.01.2023
Patent
METROLOGY METHOD AND DEVICE FOR MEASURING A PERIODIC STRUCTURE ON A SUBSTRATE
KONIJNENBERG, Alexander Prasetya, CUNBUL, Ahmet Burak, TINNEMANS, Patricius Aloysius Jacobus, WARNAAR, Patrick, VAN DE VEN, Bastiaan Lambertus Wilhelmus Marinus, TENNER, Vasco Tomas, LOMANS, Bram Antonius Gerardus, CRAMER, Hugo Augustinus Joseph
Year of Publication 02.03.2023
Get full text
Year of Publication 02.03.2023
Patent
Method and apparatus for imaging nonstationary object
VERSCHUREN, COEN ADRIANUS, ZIJP, FERRY, KONIJNENBERG, ALEXANDER PRASETYA, PANDEY, NITESH
Year of Publication 16.09.2022
Get full text
Year of Publication 16.09.2022
Patent