Extra half-plane shortening of dislocations as an origin of tensile strain in Si-doped (Al)GaN
Weinrich, J., Mogilatenko, A., Brunner, F., Koch, C. T., Weyers, M.
Published in Journal of applied physics (28.08.2019)
Published in Journal of applied physics (28.08.2019)
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Journal Article
Direct imaging of surface plasmon resonances on single triangular silver nanoprisms at optical wavelength using low-loss EFTEM imaging
Nelayah, J, Gu, L, Sigle, W, Koch, C T, Pastoriza-Santos, I, Liz-Marzán, L M, van Aken, P A
Published in Optics letters (01.04.2009)
Published in Optics letters (01.04.2009)
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Journal Article
Quantitative analysis of layering and in-plane structural ordering at an alumina–aluminum solid–liquid interface
Kauffmann, Y., Oh, S.H., Koch, C.T., Hashibon, A., Scheu, C., Rühle, M., Kaplan, W.D.
Published in Acta materialia (01.06.2011)
Published in Acta materialia (01.06.2011)
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Journal Article
Origins of electrostatic potential wells at dislocations in polycrystalline Cu(In,Ga)Se2 thin films
Dietrich, J., Abou-Ras, D., Schmidt, S. S., Rissom, T., Unold, T., Cojocaru-Mirédin, O., Niermann, T., Lehmann, M., Koch, C. T., Boit, C.
Published in Journal of applied physics (14.03.2014)
Published in Journal of applied physics (14.03.2014)
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Journal Article
Determination of grain boundary potentials in ceramics: Combining impedance spectroscopy and inline electron holography
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Journal Article
Conference Proceeding
Study of coherence strain of GP II zones in an aged aluminum composite
Hernández-Rivera, J.L., Rivera, J.J. Cruz, Koch, C.T., Özdöl, V.B., Martínez-Sánchez, R.
Published in Journal of alloys and compounds (25.09.2012)
Published in Journal of alloys and compounds (25.09.2012)
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Journal Article
Conference Proceeding
Charge-Trapping-Induced Compensation of the Ferroelectric Polarization in FTJs: Optimal Conditions for a Synaptic Device Operation
Fontanini, R., Segatto, M., Nair, K. S., Holzer, M., Driussi, F., Hausler, I., Koch, C. T., Dubourdieu, C., Deshpande, V., Esseni, D.
Published in IEEE transactions on electron devices (01.07.2022)
Published in IEEE transactions on electron devices (01.07.2022)
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Journal Article
Off-axis and inline electron holography: Experimental comparison
Latychevskaia, Tatiana, Formanek, Petr, Koch, C.T., Lubk, Axel
Published in Ultramicroscopy (01.04.2010)
Published in Ultramicroscopy (01.04.2010)
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Journal Article
Sub-Kelvin cooler configuration study for the Background Limited Infrared Submillimeter Spectrometer BLISS on SPICA
Holmes, W., Bock, J.J., Matt Bradford, C., Chui, T.C.P., Koch, T.C., Lamborn, A.U., Moore, D., Paine, C.G., Thelen, M.P., Yazzie, A.
Published in Cryogenics (Guildford) (01.09.2010)
Published in Cryogenics (Guildford) (01.09.2010)
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Journal Article
Conference Proceeding
Aspects regarding measurement of thickness of intergranular glassy films
BHATTACHARYYA, S., SUBRAMANIAM, A., KOCH, C. T., RÜHLE, M.
Published in Journal of microscopy (Oxford) (01.01.2006)
Published in Journal of microscopy (Oxford) (01.01.2006)
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Journal Article
Strain mapping for advanced CMOS technologies
Özdöl, V. B., Tyutyunnikov, D., Koch, C. T., van Aken, P. A.
Published in Crystal research and technology (1979) (01.01.2014)
Published in Crystal research and technology (1979) (01.01.2014)
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Journal Article
Interfaces and Extended Structural Defects in Chalcopyrite Thin-Film Solar Cells Studied by Transmission Electron Microscopy
Schmidt, S. S., Dietrich, J., Koch, C. T., Schaffer, B., Schaffer, M., Klingsporn, M., Merdes, S., Abou-Ras, D.
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Journal Article
EFTEM study of surface plasmon resonances in silver nanoholes
Sigle, W., Nelayah, J., Koch, C.T., Ögüt, B., Gu, L., van Aken, P.A.
Published in Ultramicroscopy (01.07.2010)
Published in Ultramicroscopy (01.07.2010)
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Journal Article