Intrinsic Vulnerability to Soft Errors and a Mitigation Technique by Layout Optimization on DICE Flip Flops in a 65-nm Bulk Process
Mori, Fuma, Ebara, Mitsunori, Tsukita, Yuto, Furuta, Jun, Kobayashi, Kazutoshi
Published in IEEE transactions on nuclear science (01.08.2021)
Published in IEEE transactions on nuclear science (01.08.2021)
Get full text
Journal Article
Extracting Voltage Dependence of BTI-induced Degradation Without Temporal Factors by Using BTI-Sensitive and BTI-Insensitive Ring Oscillators
Kishida, Ryo, Asuke, Takuya, Furuta, Jun, Kobayashi, Kazutoshi
Published in IEEE transactions on semiconductor manufacturing (01.05.2020)
Published in IEEE transactions on semiconductor manufacturing (01.05.2020)
Get full text
Journal Article
An Efficient and Accurate Time Step Control Method for Power Device Transient Simulation Utilizing Dominant Time Constant Approximation
Kumashiro, Shigetaka, Kamei, Tatsuya, Hiroki, Akira, Kobayashi, Kazutoshi
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.02.2020)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.02.2020)
Get full text
Journal Article
A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment
Yoshikawa, Takefumi, Ishimaru, Masahiro, Iwata, Tatsuya, Mori, Fuma, Kobayashi, Kazutoshi
Published in Journal of electronic testing (01.12.2021)
Published in Journal of electronic testing (01.12.2021)
Get full text
Journal Article
Process Dependence of Soft Errors Induced by Alpha Particles, Heavy Ions, and High Energy Neutrons on Flip Flops in FDSOI
Ebara, Mitsunori, Yamada, Kodai, Kojima, Kentaro, Furuta, Jun, Kobayashi, Kazutoshi
Published in IEEE journal of the Electron Devices Society (2019)
Published in IEEE journal of the Electron Devices Society (2019)
Get full text
Journal Article
Frequency Dependency of Soft Error Rates Based on Dynamic Soft Error Measurements
Sugisaki, Haruto, Nakajima, Ryuichi, Sugitani, Shotaro, Furuta, Jun, Kobayashi, Kazutoshi
Published in 2023 International Conference on IC Design and Technology (ICICDT) (25.09.2023)
Published in 2023 International Conference on IC Design and Technology (ICICDT) (25.09.2023)
Get full text
Conference Proceeding
The Contribution of Secondary Particles Following Carbon Ion Radiotherapy to Soft Errors in CIEDs
Kawakami, Yudai, Sakai, Makoto, Masuda, Hiroaki, Miyajima, Masami, Kanzaki, Takao, Kobayashi, Kazutoshi, Ohno, Tatsuya, Sakurai, Hiroshi
Published in IEEE open journal of engineering in medicine and biology (01.01.2024)
Published in IEEE open journal of engineering in medicine and biology (01.01.2024)
Get full text
Journal Article
An Area-Efficient 65 nm Radiation-Hard Dual-Modular Flip-Flop to Avoid Multiple Cell Upsets
Yamamoto, R., Hamanaka, C., Furuta, J., Kobayashi, K., Onodera, H.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
Get full text
Journal Article
Radiation hardness evaluations of 65 nm fully depleted silicon on insulator and bulk processes by measuring single event transient pulse widths and single event upset rates
Furuta, Jun, Sonezaki, Eiji, Kobayashi, Kazutoshi
Published in Japanese Journal of Applied Physics (01.04.2015)
Published in Japanese Journal of Applied Physics (01.04.2015)
Get full text
Journal Article
An accurate metric to control time step of transient device simulation by matrix exponential method
Kumashiro, Shigetaka, Kamei, Tatsuya, Hiroki, Akira, Kobayashi, Kazutoshi
Published in 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2017)
Published in 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2017)
Get full text
Conference Proceeding
Initial and long-term frequency degradation of ring oscillators caused by plasma-induced damage in 65 nm bulk and fully depleted silicon-on-insulator processes
Kishida, Ryo, Oshima, Azusa, Yabuuchi, Michitarou, Kobayashi, Kazutoshi
Published in Japanese Journal of Applied Physics (01.04.2015)
Published in Japanese Journal of Applied Physics (01.04.2015)
Get full text
Journal Article