Bottom-tracking: the possibilities and physical meaning of keeping the bottom of the frequency shift in atomic force microscopy
Damiron, Denis, Allain, Pierre E., Kobayashi, Dai, Sasaki, Naruo, Kawakatsu, Hideki
Published in Japanese Journal of Applied Physics (01.08.2020)
Published in Japanese Journal of Applied Physics (01.08.2020)
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Journal Article
Photothermal excitation and laser Doppler velocimetry of higher cantilever vibration modes for dynamic atomic force microscopy in liquid
Nishida, Shuhei, Kobayashi, Dai, Sakurada, Takeo, Nakazawa, Tomonori, Hoshi, Yasuo, Kawakatsu, Hideki
Published in Review of scientific instruments (01.12.2008)
Published in Review of scientific instruments (01.12.2008)
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Journal Article
Plasma Process Classification Using Causal Discovery Technique
Dai, KOBAYASHI, Masaki, KITSUNEZUKA, Yuki, KATAOKA, Jun, SHINAGAWA
Published in 2022 International Symposium on Semiconductor Manufacturing (ISSM) (12.12.2022)
Published in 2022 International Symposium on Semiconductor Manufacturing (ISSM) (12.12.2022)
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Conference Proceeding
A micromachined impact microactuator driven by electrostatic force
Mita, M., Arai, M., Tensaka, S., Kobayashi, D., Fujita, H.
Published in Journal of microelectromechanical systems (01.02.2003)
Published in Journal of microelectromechanical systems (01.02.2003)
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Journal Article
All-optic UHV Atomic Force Microscopy
DAMIRON, Denis, ALLAIN, Pierre E., TORIYAMA, Yohei, OTHMAN, Mohammad, KOBAYASHI, Dai, KAWAKATSU, Hideki
Published in SEISAN KENKYU (2015)
Published in SEISAN KENKYU (2015)
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Journal Article
New FM Detection Techniques for Scanning Probe Microscopy
Kobayashi, Dai, Kawai, Shigeki, Kawakatsu, Hideki
Published in Japanese Journal of Applied Physics (01.07.2004)
Published in Japanese Journal of Applied Physics (01.07.2004)
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Journal Article