Flash Reliability Boost Huffman coding (FRBH): Co-optimization of data compression and Vth distribution modulation to enhance data-retention time by over 2900x
Deguchi, Yoshiaki, Kobayashi, Atsuro, Watanabe, Hikaru, Takeuchi, Ken
Published in 2017 Symposium on VLSI Technology (01.06.2017)
Published in 2017 Symposium on VLSI Technology (01.06.2017)
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Conference Proceeding
Real usage-based precise reliability test by extracting read/write/retention-mixed real-life access of NAND flash memory from system-level SSD emulator
Yamaga, Yusuke, Matsui, Chihiro, Sakaki, Yukiya, Kobayashi, Atsuro, Takeuchi, Ken
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
Versatile TLC NAND flash memory control to reduce read disturb errors by 85% and extend read cycles by 6.7-times of Read-Hot and Cold data for cloud data centers
Kobayashi, Atsuro, Tokutomi, Tsukasa, Takeuchi, Ken
Published in 2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits) (01.06.2016)
Published in 2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits) (01.06.2016)
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Conference Proceeding
12× bit-error acceptable, 300× extended data-retention time, value-aware SSD with vertical 3D-TLC NAND flash memories for image recognition
Deguchi, Yoshiaki, Nakamura, Toshiki, Kobayashi, Atsuro, Takeuchi, Ken
Published in 2017 IEEE Custom Integrated Circuits Conference (CICC) (01.04.2017)
Published in 2017 IEEE Custom Integrated Circuits Conference (CICC) (01.04.2017)
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Conference Proceeding
Quick-low-density parity check and dynamic threshold voltage optimization in 1X nm triple-level cell NAND flash memory with comprehensive analysis of endurance, retention-time, and temperature variation
Doi, Masafumi, Tokutomi, Tsukasa, Hachiya, Shogo, Kobayashi, Atsuro, Tanakamaru, Shuhei, Ning, Sheyang, Iwasaki, Tomoko Ogura, Takeuchi, Ken
Published in Japanese Journal of Applied Physics (01.08.2016)
Published in Japanese Journal of Applied Physics (01.08.2016)
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Journal Article
7.7 Enterprise-grade 6x fast read and 5x highly reliable SSD with TLC NAND-flash memory for big-data storage
Tokutomi, Tsukasa, Doi, Masafumi, Hachiya, Shogo, Kobayashi, Atsuro, Tanakamaru, Shuhei, Takeuchi, Ken
Published in 2015 IEEE International Solid State Circuits Conference (ISSCC) (01.02.2015)
Published in 2015 IEEE International Solid State Circuits Conference (ISSCC) (01.02.2015)
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Conference Proceeding
Journal Article
MODIFICATION OF THE GAS OUTLET STRUCTURE ON THE SPOUTED BED WITH INNER DRAFT-TUBE
HATTORI, HIROTSUGU, KOBAYASHI, ATSURO, AIBA, IWAO, KODA, TETSUYA
Published in JOURNAL OF CHEMICAL ENGINEERING OF JAPAN (01.01.1984)
Published in JOURNAL OF CHEMICAL ENGINEERING OF JAPAN (01.01.1984)
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Journal Article
Zur Ableitung der Ermudungs Kurve
NISHIHARA, Toshio, KOBAYASHI, Atsuro
Published in Transactions of the Japan Society of Mechanical Engineers (25.02.1947)
Published in Transactions of the Japan Society of Mechanical Engineers (25.02.1947)
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Journal Article