by Gates, S., Papa Rao, S., Anandan, V., Krishnan, M., Cohen, S., Ostrovski, Y., Klymko, N., Chace, M., Canaperi, D.
Published in Microelectronic engineering (01.03.2012)

by Cheng, K., Seo, S., Faltermeier, J., Lu, D., Standaert, T., Ok, I., Khakifirooz, A., Vega, R., Levin, T., Li, J., Demarest, J., Surisetty, C., Song, D., Utomo, H., Chao, R., He, H., Madan, A., DeHaven, P., Klymko, N., Zhu, Z., Naczas, S., Yin, Y., Kuss, J., Jacob, A., Bae, D., Seo, K., Kleemeier, W., Sampson, R., Hook, T., Haran, B., Gifford, G., Gupta, D., Shang, H., Bu, H., Na, M., Oldiges, P., Wu, T., Doris, B., Rim, K., Nowak, E., Divakaruni, R., Khare, M.
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)

by Guangrui Xia, Nayfeh, H.M., Lee, M.L., Fitzgerald, E.A., Antoniadis, D.A., Anjum, D.H., Jian Li, Hull, R., Klymko, N., Hoyt, J.L.
Published in IEEE transactions on electron devices (01.12.2004)

by DRAKE, T. S, CHLEIRIGH, C. Ni, HOYT, J. L, LEE, M. L, PITERA, A. J, FITZGERALD, E. A, ANTONIADIS, D. A, ANJUM, D. H, LI, J, HULL, R, KLYMKO, N
Published in Journal of electronic materials (01.09.2003)

by de Rijk, M, Cieszkowski, R, Klymko, N, Sartori, A, Verstegen, A
Published in Continence (Amsterdam) (01.10.2024)

by Qiqing Ouyang, Min Yang, Holt, J., Panda, S., Huajie Chen, Utomo, H., Fischetti, M., Rovedo, N., Jinghong Li, Klymko, N., Wildman, H., Kanarsky, T., Costrini, G., Fried, D.M., Bryant, A., Ott, J.A., Meikei Ieong, Chun-Yung Sung
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)

by Edelstein, D., Rathore, H., Davis, C., Clevenger, L., Cowley, A., Nogami, T., Agarwala, B., Arai, S., Carbone, A., Chanda, K., Chen, F., Cohen, S., Cote, W., Cullinan, M., Dalton, T., Das, S., Davis, P., Demarest, J., Dunn, D., Dziobkowski, C., Filippi, R., Fitzsimmons, J., Flaitz, P., Gates, S., Gill, J., Grill, A., Hawken, D., Ida, K., Klaus, D., Klymko, N., Lane, M., Lane, S., Lee, J., Landers, W., Li, W.-K., Lin, Y.-H., Liniger, E., Liu, X.-H., Madan, A., Malhotra, S., Martin, J., Molis, S., Muzzy, C., Nguyen, D., Nguyen, S., Ono, M., Parks, C., Questad, D., Restaino, D., Sakamoto, A., Shaw, T., Shimooka, Y., Simon, A., Simonyi, E., Swift, A., Van Kleeck, T., Vogt, S., Wang, Y.-Y., Wille, W., Wright, J., Yang, C.-C., Yoon, M., Ivers, T.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)

by Liu, F., Yu, R.R., Young, A.M., Doyle, J.P., Wang, X., Shi, L., Chen, K.-N., Li, X., Dipaola, D.A., Brown, D., Ryan, C.T., Hagan, J.A., Wong, K.H., Lu, M., Gu, X., Klymko, N.R., Perfecto, E.D., Merryman, A.G., Kelly, K.A., Purushothaman, S., Koester, S.J., Wisnieff, R., Haensch, W.
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)

by Maitra, K, Khakifirooz, A, Kulkarni, P, Basker, V S, Faltermeier, J, Jagannathan, H, Adhikari, H, Chun-Chen Yeh, Klymko, N R, Saenger, K, Standaert, T, Miller, R J, Doris, B, Paruchuri, V K, McHerron, D, O'Neil, J, Leobundung, E, Huiming Bu
Published in IEEE electron device letters (01.06.2011)

by Belyansky, Michael P., Conti, Richard, Khan, Shahrukh, Zhou, Xin, Klymko, Nancy R, Yao, Yiping, Madan, Anita, Tai, Leo, Flaitz, Philip, Ando, Takashi
Published in ECS transactions (26.03.2014)

by Nguyen, Son van, Priyadarshini, Deepika, Shobha, Hosadurga k, Haigh, Thomas J, Hu, Chao-kun, Cohen, Stephan A, Liniger, Eric, Shaw, Thomas M, Adams, Edward D, Burnham, Jay, Madan, Anita, Klymko, Nancy R, Parks, Christopher, Yang, Daewon, Molis, Steven E, Lin, Y, Bonilla, Griselda, Grill, Alfred, Edelstein, Daniel, Canaperi, Donald F, Xia, Li-Qun, Reiter, Steven, Balseanu, Mihaela, Shek, Mei-Yee
Published in ECS transactions (26.03.2014)

by GRILL, A, EDELSTEIN, D, COHEN, S, SIMONYI, E, KLYMKO, N, LANE, S, IDA, K, VOGT, S, VAN KLEECK, T, DAVIS, C, ONO, M, NOGAMI, T, RESTAINO, D, IVERS, T, LANE, M, GATES, S, LINIGER, E, SHAW, T, LIU, X.-H, KLAUS, D, PATEL, V
Year of Publication 2004

by Edelstein, D., Davis, C., Clevenger, L., Yoon, M., Cowley, A., Nogami, T., Rathore, H., Agarwala, B., Arai, S., Carbone, A., Chanda, K., Cohen, S., Cote, W., Cullinan, M., Dalton, T., Das, S., Davis, P., Demarest, J., Dunn, D., Dziobkowski, C., Filippi, R., Fitzsimmons, J., Flaitz, P., Gates, S., Gill, J., Grill, A., Hawken, D., Ida, K., Klaus, D., Klymko, N., Lane, M., Lane, S., Lee, J., Landers, W., Li, W.-K., Lin, Y.-H., Liniger, E., Liu, X.-H., Madan, A., Malhotra, S., Martin, J., Molis, S., Muzzy, C., Nguyen, D., Nguyen, S., Ono, M., Parks, C., Questad, D., Restaino, D., Sakamoto, A., Shaw, T., Shimooka, Y., Simon, A., Simonyi, E., Tempest, S., Van Kleeck, T., Vogt, S., Wang, Y.-Y., Wille, W., Wright, J., Yang, C.-C., Ivers, T.
Published in Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) (2004)

by Jin, M., Tian, C. E., La Rosa, G., Uppal, S., Mcmahon, W., Kothari, H., Liu, Y., Cartier, E., Lai, W. L., Dasgupta, A., Polvino, S., Belyansky, M., Chen, A., Zhou, X., Madan, A., Yao, Y., Klymko, N., Narayanan, V.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)

by Nguyen, Son V., Haigh, Thomas, Shaw, Thomas, Molis, Steven, Dziobkowski, Chet, Zahakos, C., Cohen, Steve, Shobha, Hosadurga, Liniger, E., Hu, C. K., Bonilla, Griselda, Klymko, Nancy, Grill, Alfred
Published in ECS transactions (01.01.2010)

by Yu, R.R., Liu, F., Polastre, R.J., Chen, K.-N., Liu, X.H., Shi, L., Perfecto, E.D., Klymko, N.R., Chace, M.S., Shaw, T.M., Dimilia, D., Kinser, E.R., Young, A.M., Purushothaman, S., Koester, S.J., Haensch, W.
Published in 2009 Symposium on VLSI Technology (01.06.2009)

by I. V. Avdeev, O. V. Nemykina, А. N. Klymko, V. L. Prihno, V. V. Baranets
Published in Elektrotekhnika ta elektroenerhetyka (01.07.2012)

by Nguyen, Son V., Liniger, E., Ida, K., Herbst, B., Malone, K., Klymko, N., Cohen, S., Simonyi, E., Dziobkowski, C., Lane, S., Grill, A., Restaino, D., Gates, S., Edelstein, D., Nogami, T., Ivers, T.
Published in ECS transactions (28.09.2007)

by Belyansky, Michael, Domenicucci, A, Klymko, N, Li, J, Madan, A
Published in Solid state technology (01.02.2009)

by Cheng, K., Khakifirooz, A., Loubet, N., Luning, S., Nagumo, T., Vinet, M., Liu, Q., Reznicek, A., Adam, T., Naczas, S., Hashemi, P., Kuss, J., Li, J., He, H., Edge, L., Gimbert, J., Khare, P., Zhu, Y., Zhu, Z., Madan, A., Klymko, N., Holmes, S., Levin, T. M., Hubbard, A., Johnson, R., Terrizzi, M., Teehan, S., Upham, A., Pfeiffer, G., Wu, T., Inada, A., Allibert, F., Nguyen, B., Grenouillet, L., Le Tiec, Y., Wacquez, R., Kleemeier, W., Sampson, R., Dennard, R. H., Ning, T. H., Khare, M., Shahidi, G., Doris, B.
Published in 2012 International Electron Devices Meeting (01.12.2012)