Thin gate and poly oxides by high pressure silicon oxidation
TAY, S. P, ELLUL, J. P, WHITE, J. J, KING, M. I. H
Published in Journal of the Electrochemical Society (01.06.1987)
Published in Journal of the Electrochemical Society (01.06.1987)
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Journal Article
Features and mechanisms of the saturating hot-carrier degradation in LDD NMOSFETs
Raychaudhuri, A., Deen, M.J., Kwan, W.S., King, M.I.H.
Published in IEEE transactions on electron devices (01.07.1996)
Published in IEEE transactions on electron devices (01.07.1996)
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Journal Article
A simple method to qualify the LDD structure against the early mode of hot-carrier degradation
Raychaudhuri, A., Deen, M.J., King, M.I.H., Wing Suen Kwan
Published in IEEE transactions on electron devices (01.01.1996)
Published in IEEE transactions on electron devices (01.01.1996)
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Journal Article
"The Contours Of A Historic Reconciliation Are Before Us"
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IVB-2 memory effect and enhanced conductivity in Si-implanted thermally grown SiO(2 < /inf >
Kalnitsky, A, King, M I H, Boothroyd, A R, Ellul, J P, Hadaway, R A
Published in IEEE transactions on electron devices (01.11.1987)
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Published in IEEE transactions on electron devices (01.11.1987)
Journal Article