SET/CMOS hybrid process and multiband filtering circuits
SONG, Ki-Whan, YONG KYU LEE, JAE SUNG SIM, JEOUNG, Hoon, JONG DUK LEE, PARK, Byung-Gook, YOU SEUNG JIN, KIM, Young-Wug
Published in IEEE transactions on electron devices (01.08.2005)
Published in IEEE transactions on electron devices (01.08.2005)
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Journal Article
Application of high pressure deuterium annealing for improving the hot carrier reliability of CMOS transistors
Jinju Lee, Kangguo Cheng, Zhi Chen, Hess, K., Lyding, J.W., Young-Kwang Kim, Hyui-Seung Lee, Young-Wug Kim, Kwang-Pyuk Suh
Published in IEEE electron device letters (01.05.2000)
Published in IEEE electron device letters (01.05.2000)
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Journal Article
Ultrathin gate oxide grown on nitrogen-implanted silicon for deep submicron CMOS transistors
Nam, In-Ho, Sim, Jae Sung, Hong, Sung In, Park, Byung-Gook, Lee, Jong Duk, Lee, Seung-Woo, Kang, Man-Sug, Kim, Young-Wug, Suh, Kwang-Pyuk, Lee, Won Seong
Published in IEEE transactions on electron devices (01.10.2001)
Published in IEEE transactions on electron devices (01.10.2001)
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Journal Article
A 0.25-μm, 600-MHz, 1.5-V, fully depleted SOI CMOS 64-bit microprocessor
Park, Sung Bae, Kim, Young Wug, Ko, Young Gun, Kim, Kwang Il, Kim, Il Kwon, Kang, Hee-Sung, Yu, Jin Oh, Suh, Kwang Pyuk
Published in IEEE journal of solid-state circuits (01.11.1999)
Published in IEEE journal of solid-state circuits (01.11.1999)
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Journal Article
Complementary Self-Biased Logics Based on Single-Electron Transistor (SET)/CMOS Hybrid Process
Song, Ki-Whan, Lee, Yong Kyu, Sim, Jae Sung, Kim, Kyung Rok, Lee, Jong Duk, Park, Byung-Gook, You, Young Sub, Park, Joo-On, Jin, You Seung, Kim, Young-Wug
Published in Japanese Journal of Applied Physics (01.04.2005)
Published in Japanese Journal of Applied Physics (01.04.2005)
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Journal Article
Improved hot-carrier reliability of SOI transistors by deuterium passivation of defects at oxide/silicon interfaces
Kangguo Cheng, Jinju Lee, Karl, H., Lyding, J.W., Young-Kwang Kim, Young-Wug Kim, Kwang-Pyuk Suh
Published in IEEE transactions on electron devices (01.03.2002)
Published in IEEE transactions on electron devices (01.03.2002)
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Journal Article
Separation of hot-carrier-induced interface trap creation and oxide charge trapping in PMOSFETs studied by hydrogen/deuterium isotope effect
Cheng, K., Lee, J., Lyding, J.W., Young-Kwang Kim, Young-Wug Kim, Kuang Pyuk Suh
Published in IEEE electron device letters (01.04.2001)
Published in IEEE electron device letters (01.04.2001)
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Journal Article
An alternative interpretation of hot electron interface degradation in NMOSFETs: isotope results irreconcilable with major defect generation by holes?
Hess, K., Jinju Lee, Zhi Chen, Lyding, J.W., Young-Kwang Kim, Bong-Seok Kim, Yong-Hee Lee, Young-Wug Kim, Kwang-Pyuk Suh
Published in IEEE transactions on electron devices (01.09.1999)
Published in IEEE transactions on electron devices (01.09.1999)
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Journal Article
Effect of the silicidation reaction condition on the gate oxide integrity in Ti-polycide gate
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Conference Proceeding
Journal Article
PEDAL DEVICE AND MANUFACTURING METHOD THEREOF
PARK WI SANG, KIM DONG HWAN, KIM JUN WOO, HONG GAP PYO, KIM YOUNG WUG, LEE JUNG MIN
Year of Publication 20.09.2018
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Year of Publication 20.09.2018
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