Lens-free reflective topography for high-resolution wafer inspection
Lee, Hojun, Sung, Jangwoon, Park, Seungbeom, Shin, Junho, Kim, Hyungjin, Kim, Wookrae, Lee, Myungjun
Published in Scientific reports (08.05.2024)
Published in Scientific reports (08.05.2024)
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Journal Article
Edge roughness analysis in nanoscale for single-molecule localization microscopy images
Jeong, Uidon, Go, Ga-eun, Jeong, Dokyung, Lee, Dongmin, Kim, Min Jeong, Kang, Minjae, Kim, Namyoon, Jung, Jaehwang, Kim, Wookrae, Lee, Myungjun, Kim, Doory
Published in Nanophotonics (Berlin, Germany) (24.01.2024)
Published in Nanophotonics (Berlin, Germany) (24.01.2024)
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Journal Article
Scanning Magneto-optic Kerr effect microscope for inspection of MRAM manufacturing
Numata, Mitsunori, Kim, Ingi, Suzuki, Kenji, Ueyama, Shinji, Kim, Jinseob, Kim, Wookrae, Lee, Myungjun
Published in IEEE transactions on magnetics (01.11.2023)
Published in IEEE transactions on magnetics (01.11.2023)
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Journal Article
Fourier ptychographic topography
Wang, Hao, Zhu, Jiabei, Sung, Jangwoon, Hu, Guorong, Greene, Joseph, Li, Yunzhe, Park, Seungbeom, Kim, Wookrae, Lee, Myungjun, Yang, Yusin, Tian, Lei
Published in Optics express (27.03.2023)
Published in Optics express (27.03.2023)
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Journal Article
Development of Highly Dense Material-Specific Fluorophore Labeling Method on Silicon-Based Semiconductor Materials for Three-Dimensional Multicolor Super-Resolution Fluorescence Imaging
Jeong, Uidon, Jeong, Dokyung, Go, Seokran, Park, Hyunbum, Kim, Geun-ho, Kim, Namyoon, Jung, Jaehwang, Kim, Wookrae, Lee, Myungjun, Choi, Changhoon, Kim, Doory
Published in Chemistry of materials (25.07.2023)
Published in Chemistry of materials (25.07.2023)
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Journal Article
Quasieigenstate coalescence in an atom-cavity quantum composite
Choi, Youngwoon, Kang, Sungsam, Lim, Sooin, Kim, Wookrae, Kim, Jung-Ryul, Lee, Jai-Hyung, An, Kyungwon
Published in Physical review letters (16.04.2010)
Published in Physical review letters (16.04.2010)
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Journal Article
Multi spectral holographic ellipsometry for a complex 3D nanostructure
Jung, Jaehwang, Kim, Wookrae, Kim, Jinseob, Lee, Seungwoo, Shin, Inho, Yoon, Changhyeong, Jeong, Seoyeon, Hidaka, Yasuhiro, Numata, Mitsunori, Ueyama, Shinji, Choi, Changhoon, Lee, Myungjun
Published in Optics express (19.12.2022)
Published in Optics express (19.12.2022)
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Journal Article
Controlled generation of single photons in a coupled atom-cavity system at a fast repetition-rate
Kang, Sungsam, Lim, Sooin, Hwang, Myounggyu, Kim, Wookrae, Kim, Jung-Ryul, An, Kyungwon
Published in Optics express (31.01.2011)
Published in Optics express (31.01.2011)
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Journal Article
Tunneling-Induced Spectral Broadening of a Single Atom in a Three-Dimensional Optical Lattice
Kim, Wookrae, Park, Changwon, Kim, Jung-Ryul, Choi, Youngwoon, Kang, Sungsam, Lim, Sooin, Lee, Yea-Lee, Ihm, Jisoon, An, Kyungwon
Published in Nano letters (09.02.2011)
Published in Nano letters (09.02.2011)
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Journal Article
Hyperspectral Imaging Reflectometry for 3D Semiconductor Metrology
Kim, Jinseob, Park, Gwangsik, Han, Daehoon, Kim, Wookrae, Lee, Myungjun
Published in 2021 Conference on Lasers and Electro-Optics (CLEO) (01.05.2021)
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Published in 2021 Conference on Lasers and Electro-Optics (CLEO) (01.05.2021)
Conference Proceeding
SEMICONDUCTOR MEASUREMENT APPARATUS
Hidaka, Yasuhiro, Kim, Jinseob, Kim, Wookrae, Kim, Ingi, Kim, Jinyong
Year of Publication 29.08.2024
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Year of Publication 29.08.2024
Patent
METHOD OF MANAGING SEMICONDUCTOR PROCESSING APPARATUS
SHIN, Junho, KIM, Wookrae, LEE, Myungjun, LEE, Hojun, PARK, Seungbeom, SUNG, Jangwoon
Year of Publication 15.08.2024
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Year of Publication 15.08.2024
Patent
SEMICONDUCTOR MEASUREMENT APPARATUS
JIN, Younguk, KIM, Wookrae, JANG, Sungho, CHOI, Garam, KIM, Jinseob, KIM, Jinyong, HAN, Daehoon
Year of Publication 11.07.2024
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Year of Publication 11.07.2024
Patent