Ischemic compression after trigger point injection affect the treatment of myofascial trigger points
Kim, Soo A, Oh, Ki Young, Choi, Won Hyuck, Kim, In Kyum
Published in Annals of rehabilitation medicine (01.08.2013)
Published in Annals of rehabilitation medicine (01.08.2013)
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Journal Article
Nodal line optimization and its application to violin top plate design
Yu, Yonggyun, Jang, In Gwun, Kim, In Kyum, Kwak, Byung Man
Published in Journal of sound and vibration (25.10.2010)
Published in Journal of sound and vibration (25.10.2010)
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Journal Article
Study of Nickel Silicide Thermal Stability Using Silicon-on-Insulator Substrate for Nanoscale Complementary Metal Oxide Semiconductor Field-Effect Transisor Device
Kim, Ji-Young, Kim, Cho-Rong, Lee, Jaeyeop, Park, Won-Wook, Leem, Jae-Young, Ryu, Hyukhyun, Lee, Won-Jae, Zhang, Ying-Ying, Jung, Soon-Yen, Lee, Hi-Deok, Kim, In-Kyum, Kang, Suk-June, Yuk, Hyung-Sang, Lee, Keunwoo, Jeon, Sunyeol, Jeon, Hyeongtag
Published in Japanese Journal of Applied Physics (01.10.2008)
Published in Japanese Journal of Applied Physics (01.10.2008)
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Journal Article
Effects of Strained Silicon Layer on Nickel (Germano)silicide for Nanoscale Complementary Metal Oxide Semiconductor Field-Effect Transistor Device
Kim, Ji-Young, Kim, Cho-Rong, Lee, Jaeyeop, Park, Won-Wook, Leem, Jae-Young, Ryu, Hyukhyun, Lee, Won-Jae, Zhang, Ying-Ying, Jung, Soon-Yen, Lee, Hi-Deok, Kim, In-Kyum, Kang, Suk-June, Yuk, Hyung-Sang, Lee, Keunwoo, Jeon, Sunyeol, Jeon, Hyeongtag
Published in Japanese Journal of Applied Physics (01.10.2008)
Published in Japanese Journal of Applied Physics (01.10.2008)
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Journal Article
Estimating approximate construction duration of CFRD in the planning stage
Kim, Kyong Ju, Yun, Won Gun, Kim, In Kyum
Published in KSCE journal of civil engineering (01.11.2016)
Published in KSCE journal of civil engineering (01.11.2016)
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Journal Article
Formation of High Quality Strained-Si / Strained-SiGe Layers Grown on Relaxed SiGe Virtual Substrates for Advanced CMOS Application
In-kyum Kim, Suk-june Kang, Hyung-sang Yuk, Dong-kun Lee, Bo-young Lee
Published in 2006 International SiGe Technology and Device Meeting (2006)
Published in 2006 International SiGe Technology and Device Meeting (2006)
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Conference Proceeding
Strain Degradation in Strained-Si Layers Far Thicker than the Critical Thickness Grown on Relaxed Si 0.65 Ge 0.35 Layers
Kang, Suk June, Yuk, Hyung-Sang, Kim, In-Kyum, Lee, Jea-Chun, Lee, Sang-Hyun, Shim, Jung-Jin, Lee, Bo-Young, Fiorenza, J. G., Curtin, M., Lochtefeld, Anthony
Published in ECS transactions (20.10.2006)
Published in ECS transactions (20.10.2006)
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Journal Article
Strain Degradation in Strained-Si Layers Far Thicker Than the Critical Thickness Grown on Relaxed Si0.65Ge035 Layers
Kang, Suk June, Yuk, Hyung-Sang, Kim, In-Kyum, Lee, Jea-Chun, Lee, Sang-Hyun, Shim, Jung-Jin, Lee, Bo-Young
Published in Meeting abstracts (Electrochemical Society) (30.06.2006)
Published in Meeting abstracts (Electrochemical Society) (30.06.2006)
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Journal Article