Determination of Optical Constants of Thin Films from Measurements of Reflectance and Transmittance
Qingshan Bie, Qingshan Bie, Byung-ki Cheong, Byung-ki Cheong, Moonkyo Chung, Moonkyo Chung, Zhensu Lin, Zhensu Lin, Taek Sung Lee, Taek Sung Lee, Won Mok Kim, Won Mok Kim, Soon Gwang Kim, Soon Gwang Kim
Published in Japanese Journal of Applied Physics (01.09.2000)
Published in Japanese Journal of Applied Physics (01.09.2000)
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