Search Results - "KIM CHANG OUK" :: K.UTB vyhledávací portál

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Recurrent feature-incorporated convolutional neural network for virtual metrology of the chemical mechanical planarization process

by Lee, Ki Bum, Kim, Chang Ouk
Published in Journal of intelligent manufacturing (01.01.2020)

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Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels

by Park, Seyoung, Jang, Jaeyeon, Kim, Chang Ouk
Published in Journal of intelligent manufacturing (2021)

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Semisupervised sentiment analysis method for online text reviews

by Lee, Gyeong Taek, Kim, Chang Ouk, Song, Min
Published in Journal of information science (01.06.2021)

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A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes

by Lee, Ki Bum, Cheon, Sejune, Kim, Chang Ouk
Published in IEEE transactions on semiconductor manufacturing (01.05.2017)

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Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class

by Cheon, Sejune, Lee, Hankang, Kim, Chang Ouk, Lee, Seok Hyung
Published in IEEE transactions on semiconductor manufacturing (01.05.2019)

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A Deep Learning Model for Robust Wafer Fault Monitoring With Sensor Measurement Noise

by Lee, Hoyeop, Kim, Youngju, Kim, Chang Ouk
Published in IEEE transactions on semiconductor manufacturing (01.02.2017)

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A run-to-run controller for a chemical mechanical planarization process using least squares generative adversarial networks

by Kim, Sinyoung, Jang, Jaeyeon, Kim, Chang Ouk
Published in Journal of intelligent manufacturing (01.12.2021)

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State-Dependent Parameter Tuning of the Apparent Tardiness Cost Dispatching Rule Using Deep Reinforcement Learning

by Min, Byungwook, Kim, Chang Ouk
Published in IEEE access (2022)

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Performance of Machine Learning Algorithms for Class-Imbalanced Process Fault Detection Problems

by Lee, Taehyung, Lee, Ki Bum, Kim, Chang Ouk
Published in IEEE transactions on semiconductor manufacturing (01.11.2016)

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Autonomous Control of Combat Unmanned Aerial Vehicles to Evade Surface-to-Air Missiles Using Deep Reinforcement Learning

by Lee, Gyeong Taek, Kim, Chang Ouk
Published in IEEE access (2020)

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An Incremental Clustering-Based Fault Detection Algorithm for Class-Imbalanced Process Data

by Jueun Kwak, Taehyung Lee, Chang Ouk Kim
Published in IEEE transactions on semiconductor manufacturing (01.08.2015)

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Statistical Comparison of Fault Detection Models for Semiconductor Manufacturing Processes

by Taehyung Lee, Chang Ouk Kim
Published in IEEE transactions on semiconductor manufacturing (01.02.2015)

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Automatic inspection of salt-and-pepper defects in OLED panels using image processing and control chart techniques

by Kwak, Jueun, Lee, Ki Bum, Jang, Jaeyeon, Chang, Kyong Soo, Kim, Chang Ouk
Published in Journal of intelligent manufacturing (01.03.2019)

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Modular Reinforcement Learning for Autonomous UAV Flight Control

by Choi, Jongkwan, Kim, Hyeon Min, Hwang, Ha Jun, Kim, Yong-Duk, Kim, Chang Ouk
Published in Drones (Basel) (01.07.2023)

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Adaptive Weapon-to-Target Assignment Model Based on the Real-Time Prediction of Hit Probability

by Jang, Jaeyeon, Yoon, Hyui Geon, Kim, Jeong Cheol, Kim, Chang Ouk
Published in IEEE access (2019)

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Stepwise Soft Actor–Critic for UAV Autonomous Flight Control

by Hwang, Ha Jun, Jang, Jaeyeon, Choi, Jongkwan, Bae, Jung Ho, Kim, Sung Ho, Kim, Chang Ouk
Published in Drones (Basel) (01.09.2023)

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Yield Prediction Through the Event Sequence Analysis of the Die Attach Process

by Lee, Hoyeop, Kim, Chang Ouk, Ko, Hyo Heon, Kim, Min-Kyoon
Published in IEEE transactions on semiconductor manufacturing (01.11.2015)

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A multivariate parameter trace analysis for online fault detection in a semiconductor etch tool

by Ko, Jong Myoung, Kim, Chang Ouk
Published in International journal of production research (01.12.2012)

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Situation dependent decision selector for production control in testing and rework cell

by Kwak, Choonjong, Park, Eunmi, Kim, Chang Ouk
Published in International journal of production research (01.08.2011)

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METHOD AND APPARATUS FOR OPTIMIZING PROCESS CONDITIONS BASED ON QUALITY PREDICTION MODEL FOR REAL-TIME PROCESS CONTROL IN MANUFACTURING PROCESS

by JOO JAE HYEON, YOON HYUI GEON, KIM CHANG OUK
Year of Publication 05.03.2024

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