Effects of Plasma Process Induced Damages on Organic Gate Dielectrics of Organic Thin-Film Transistors
Kim, Doo-Hyun, Kim, Dong-Woo, Kim, Keon-Soo, Kim, Hyoung-Jin, Moon, Ji-Sun, Hong, Mun-Pyo, Kim, Bo-Sung, Shin, Jung-Han, Kim, Young-Min, Song, Keun-Kyu, Shin, Seong-Sik
Published in Japanese Journal of Applied Physics (01.07.2008)
Published in Japanese Journal of Applied Physics (01.07.2008)
Get full text
Journal Article
Impact of floating gate dry etching on erase characteristics in NOR flash memory
Lee, W.H., Dong-Kyu Lee, Young-Ho Na, Keon-Soo Kim, Kun-Ok Ahn, Kang-Deog Suh, Yonghan Roh
Published in IEEE electron device letters (01.08.2002)
Published in IEEE electron device letters (01.08.2002)
Get full text
Journal Article
A 7MB/s 64Gb 3-bit/cell DDR NAND flash memory in 20nm-node technology
Ki-Tae Park, Ohsuk Kwon, Sangyong Yoon, Myung-Hoon Choi, In-Mo Kim, Bo-Geun Kim, Min-Seok Kim, Yoon-Hee Choi, Seung-Hwan Shin, Youngson Song, Joo-Yong Park, Jae-Eun Lee, Chang-Gyu Eun, Ho-Chul Lee, Hyeong-Jun Kim, Jun-Hee Lee, Jong-Young Kim, Tae-Min Kweon, Hyun-Jun Yoon, Taehyun Kim, Dong-Kyo Shim, Jongsun Sel, Ji-Yeon Shin, Pansuk Kwak, Jin-Man Han, Keon-Soo Kim, Sungsoo Lee, Young-Ho Lim, Tae-Sung Jung
Published in 2011 IEEE International Solid-State Circuits Conference (01.02.2011)
Published in 2011 IEEE International Solid-State Circuits Conference (01.02.2011)
Get full text
Conference Proceeding
Influence of plasma edge damage on erase characteristics of NOR flash EEPROM using channel erase method
Dong-Kyu Lee, Lee, W.H., Young-Ho Na, Keon-Soo Kim, Kun-Ok Ahn, Kang-Deog Suh, Yonghan Roh
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)
Get full text
Conference Proceeding