Pin Accessibility Improvement with Hit-Point Distribution Metrics for Sub-4nm Standard Cell
Lee, Jaeha, Lee, Seungmin, Kim, Hyeongkyu, Yoo, Taejun, Park, Minjung, Yoon, Seiseung
Published in 2023 IEEE 36th International System-on-Chip Conference (SOCC) (05.09.2023)
Published in 2023 IEEE 36th International System-on-Chip Conference (SOCC) (05.09.2023)
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