LACBED study of a Σ3 grain boundary in a Cu +6 at% Si alloy
Kim, Hwang Su, Goodman, P, Schwartzman, A, Tulloch, P, Forwood, C.T
Published in Ultramicroscopy (01.05.1999)
Published in Ultramicroscopy (01.05.1999)
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Journal Article
Flugzeit-basierendes Massenmikroskopsystem zur Ultrahochgeschwindigkeits-multimodalen Massenanalyse
KIM, JU HWANG, YOON, SOHEE, MOON, JEONG HEE, LEE, TAE GEOL, MOON, DAE WON
Year of Publication 18.06.2014
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Year of Publication 18.06.2014
Patent
MEDIUM ENERGY ION SCATTERING SPECTROMETER
KIM, JU HWANG, YU, KYU SANG, YI, YEON JIN, KIM, WAN SUP, MOON, DAE WON
Year of Publication 10.02.2010
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Year of Publication 10.02.2010
Patent
METHOD FOR ELECTRICAL TESTING OF SEMICONDUCTOR CAPABLE OF REAL-TIME DEFECT ANALYSIS
KIM, HWANG SU, YI, JONG JIN, KWAK, JOO SEOK, KIM, DO KYUN, KIM, WOO JIN
Year of Publication 14.08.2007
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Year of Publication 14.08.2007
Patent