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METHOD FOR REDUCING OXIDATION-INDUCED STACKING FAULT OF SILICON WAFER
by
KIIRAN MAASUDEN
,
SADAMITSU SHINSUKE
Year of Publication
14.02.1995
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EVALUATION METHOD FOR SILICON WAFER
by
KIIRAN MAASUDEN
,
SADAMITSU SHINSUKE
Year of Publication
02.09.1994
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SILICON WAFER AND ITS MANUFACTURING METHOD
by
KIIRAN MAASUDEN
,
SADAMITSU SHINSUKE
,
KOIKE YASUO
,
OGUSHI SATOSHI
Year of Publication
26.08.1997
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Patent
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chemistry
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Topic
basic electric elements
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electric solid state devices not otherwise provided for
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electricity
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semiconductor devices
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investigating or analysing materials by determining theirchemical or physical properties
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English
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esp@cenet
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