Search Results - "KEVIN PETERLINZ" :: K.UTB vyhledávací portál

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In Situ Kinetics of Self-Assembly by Surface Plasmon Resonance Spectroscopy

by Peterlinz, Kevin A, Georgiadis, R
Published in Langmuir (02.10.1996)

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Observation of Hybridization and Dehybridization of Thiol-Tethered DNA Using Two-Color Surface Plasmon Resonance Spectroscopy

by Peterlinz, Kevin A, Georgiadis, Rosina M, Herne, Tonya M, Tarlov, Michael J
Published in Journal of the American Chemical Society (09.04.1997)

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Journal Article

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OPTICAL METROLOGY TOOL EQUIPPED WITH MODULATED ILLUMINATION SOURCES

by ANDREI VELDMAN, DAVID Y WANG, ANDREI V SHCHEGROV, LAWRENCE D ROTTER, GREGORY BRADY, KEVIN PETERLINZ, DERRICK SHAUGHNESSY
Year of Publication 27.12.2023

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Patent

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Absorption, Adsorption, and Desorption Studies of the Oxygen/Rh(111) System Using O2, NO, and NO2

by Peterlinz, Kevin A, Sibener, Steven J
Published in Journal of physical chemistry (1952) (01.03.1995)

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Journal Article

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SINGLE WAVELENGTH ELLIPSOMETRY MEASUREMENT METHOD

by ESEN SALCIN, WANG FUMING, URI GREENBERG, DAMON KVAMME, DANIEL R HENNIGAN, HIDONG KWAK, KEVIN PETERLINZ
Year of Publication 08.04.2021

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Patent

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OPTICAL METROLOGY TOOL EQUIPPED WITH MODULATED ILLUMINATION SOURCES

by ANDREI VELDMAN, DAVID Y WANG, ANDREI V SHCHEGROV, LAWRENCE D ROTTER, GREGORY BRADY, KEVIN PETERLINZ, DERRICK SHAUGHNESSY
Year of Publication 27.08.2020

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Patent

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OPTICAL METROLOGY TOOL EQUIPPED WITH MODULATED ILLUMINATION SOURCES

by ANDREI VELDMAN, DAVID Y WANG, ANDREI V SHCHEGROV, LAWRENCE D ROTTER, GREGORY BRADY, KEVIN PETERLINZ, DERRICK SHAUGHNESSY
Year of Publication 05.07.2018

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Patent

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ANGLE RESOLVED REFLECTOMETRY FOR THICK FILMS AND HIGH ASPECT RATIO STRUCTURES

by Wang, David Y, Peterlinz, Kevin
Year of Publication 22.08.2024

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Patent

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ANGLE RESOLVED REFLECTOMETRY FOR THICK FILMS AND HIGH ASPECT RATIO STRUCTURES

by PETERLINZ, Kevin, WANG, David Y
Year of Publication 22.08.2024

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Patent

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Optical metrology tool equipped with modulated illumination sources

by Veldman, Andrei, Shaughnessy, Derrick A, Rotter, Lawrence D, Wang, David Y, Shchegrov, Andrei V, Brady, Gregory, Peterlinz, Kevin
Year of Publication 27.02.2024

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Patent

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Methods and systems for measurement of thick films and high aspect ratio structures

by Buettner, Alexander, Peterlinz, Kevin A, Wang, David Y, Purrucker, Kerstin, Sapiens, Noam, Krishnan, Shankar
Year of Publication 14.09.2021

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Patent

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Method and system for spectroscopic beam profile metrology including a detection of collected light according to wavelength along a third dimension of a hyperspectral detector

by Peterlinz, Kevin A, Sapiens, Noam, Pandev, Stilian Ivanov, Fu, Jiyou
Year of Publication 19.03.2019

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Methods And Systems For Spectroscopic Beam Profile Metrology

by Peterlinz, Kevin A, Sapiens, Noam, Pandev, Stilian Ivanov, Fu, Jiyou
Year of Publication 06.12.2018

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Patent

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Methods And Systems For Measurement Of Thick Films And High Aspect Ratio Structures

by Buettner, Alexander, Peterlinz, Kevin A, Wang, David Y, Purrucker, Kerstin, Sapiens, Noam, Krishnan, Shankar
Year of Publication 10.09.2020

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METHODS AND SYSTEMS FOR MEASUREMENT OF THICK FILMS AND HIGH ASPECT RATIO STRUCTURES

by PETERLINZ, Kevin A, KRISHNAN, Shankar, PURRUCKER, Kerstin, SAPIENS, Noam, WANG, David Y, BUETTNER, Alexander
Year of Publication 09.09.2020

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OPTICAL METROLOGY TOOL EQUIPPED WITH MODULATED ILLUMINATION SOURCES

by Veldman, Andrei, Shaughnessy, Derrick A, Rotter, Lawrence D, Wang, David Y, Shchegrov, Andrei V, Brady, Gregory, Peterlinz, Kevin
Year of Publication 22.07.2021

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Patent