Low Energy Proton SEUs in 32-nm SOI SRAMs at Low Vdd
Rodbell, Kenneth P., Gordon, Michael S., Stawiasz, Kevin G., Oldiges, Phil, Lilja, Klas, Turowski, Marek
Published in IEEE transactions on nuclear science (01.03.2017)
Published in IEEE transactions on nuclear science (01.03.2017)
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Journal Article
Measurements of radioactive contaminants in semiconductor materials
Gordon, Michael S, Rodbell, Kenneth P, Murray, Conal E, McNally, Brendan D
Published in Semiconductor science and technology (01.12.2016)
Published in Semiconductor science and technology (01.12.2016)
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Journal Article
Ultra Low Contact Resistivities for CMOS Beyond 10-nm Node
Zhen Zhang, Koswatta, S. O., Bedell, S. W., Baraskar, A., Guillorn, M., Engelmann, S. U., Yu Zhu, Gonsalves, J., Pyzyna, A., Hopstaken, M., Witt, C., Li Yang, Fei Liu, Newbury, J., Wei Song, Cabral, C., Lofaro, M., Ozcan, A. S., Raymond, M., Lavoie, C., Sleight, J. W., Rodbell, K. P., Solomon, P. M.
Published in IEEE electron device letters (01.06.2013)
Published in IEEE electron device letters (01.06.2013)
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Journal Article
The Role of Sample Geometry on Ultra-Low Alpha Particle Emissivity Measurements
Gordon, Michael S., Rodbell, Kenneth P., Murray, Conal E., McNally, Brendan D.
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
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Journal Article
Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies
Pellish, Jonathan A., Marshall, Paul W., Rodbell, Kenneth P., Gordon, Michael S., LaBel, Kenneth A., Schwank, James R., Dodds, Nathaniel A., Castaneda, Carlos M., Berg, Melanie D., Kim, Hak S., Phan, Anthony M., Seidleck, Christina M.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches
Rodbell, K. P., Heidel, D. F., Pellish, J. A., Marshall, P. W., Tang, H. H. K., Murray, C. E., LaBel, K. A., Gordon, M. S., Stawiasz, K. G., Schwank, J. R., Berg, M. D., Kim, H. S., Friendlich, M. R., Phan, A. M., Seidleck, C. M.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser Measurements
Schwank, J R, Shaneyfelt, M R, McMorrow, D, Ferlet-Cavrois, V, Dodd, P E, Heidel, D F, Marshall, P W, Pellish, J A, LaBel, K A, Rodbell, K P, Hakey, M, Flores, R S, Swanson, S E, Dalton, S M
Published in IEEE transactions on nuclear science (01.08.2010)
Published in IEEE transactions on nuclear science (01.08.2010)
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Journal Article
Impact of Spacecraft Shielding on Direct Ionization Soft Error Rates for Sub-130 nm Technologies
Pellish, Jonathan A, Xapsos, Michael A, Stauffer, Craig A, Jordan, Thomas M, Sanders, Anthony B, Ladbury, Raymond L, Oldham, Timothy R, Marshall, Paul W, Heidel, David F, Rodbell, Kenneth P
Published in IEEE transactions on nuclear science (01.12.2010)
Published in IEEE transactions on nuclear science (01.12.2010)
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Journal Article
Hardness Assurance Testing for Proton Direct Ionization Effects
Schwank, J. R., Shaneyfelt, M. R., Ferlet-Cavrois, V., Dodd, P. E., Blackmore, E. W., Pellish, J. A., Rodbell, K. P., Heidel, D. F., Marshall, P. W., LaBel, K. A., Gouker, P. M., Tam, N., Wong, R., Shi-Jie Wen, Reed, R. A., Dalton, S. M., Swanson, S. E.
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
Ultra-Low Emissivity Alpha-Particle Detection
Gordon, M. S., Rodbell, K. P., Tang, H. H. K., Ronsheim, P., Zhu, Z., Rauch, S. E., McNally, B. D., Coleman, S.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Alpha-Particle Emission Energy Spectra From Materials Used for Solder Bumps
Gordon, M S, Rodbell, K P, Heidel, D F, Murray, C E, Tang, H H K, Dwyer-McNally, B, Warburton, W K
Published in IEEE transactions on nuclear science (01.12.2010)
Published in IEEE transactions on nuclear science (01.12.2010)
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Journal Article
Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs
Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E., McMorrow, D., Warner, J. H., Ferlet-Cavrois, V., Gouker, P. M., Melinger, J. S., Pellish, J. A., Rodbell, K. P., Heidel, D. F., Marshall, P. W., LaBel, K. A., Swanson, S. E.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Heavy Ion Testing With Iron at 1 GeV/amu
Pellish, Jonathan A, Xapsos, Michael A, LaBel, Kenneth A, Marshall, Paul W, Heidel, David F, Rodbell, Kenneth P, Hakey, Mark C, Dodd, Paul E, Shaneyfelt, Marty R, Schwank, James R, Baumann, Robert C, Xiaowei Deng, Marshall, Andrew, Sierawski, Brian D, Black, Jeffrey D, Reed, Robert A, Schrimpf, Ronald D, Kim, Hak S, Berg, Melanie D, Campola, Michael J, Friendlich, Mark R, Perez, Christopher E, Phan, Anthony M, Seidleck, Christina M
Published in IEEE transactions on nuclear science (01.10.2010)
Published in IEEE transactions on nuclear science (01.10.2010)
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Journal Article