Evaluation of Pre-Amorphous Layer by Spectroscopic Ellipsometry
Shibata, Satoshi, Kawase, Fumitoshi, Kitada, Akihiko, Kouzaki, Takashi
Published in Ion Implantation Technology 2008 (01.01.2008)
Published in Ion Implantation Technology 2008 (01.01.2008)
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Journal Article
Implant damage evaluation at high energy and low dose ion implantation using white defect of CCD image sensor
Kanazaki, E., Iwawaki, N., Kawase, F., Shibata, S.
Published in 2009 International Workshop on Junction Technology (01.06.2009)
Published in 2009 International Workshop on Junction Technology (01.06.2009)
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Conference Proceeding
Elemental analysis method and semiconductor device manufacturing method
OKANO TETSUYUKI, KAWASE FUMITOSHI, SHIBATA SATOSHI, KAMIYANAGI HISAKO
Year of Publication 03.01.2012
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Year of Publication 03.01.2012
Patent
Elemental analysis method and semiconductor device manufacturing method
Shibata, Satoshi, Kamiyanagi, Hisako, Kawase, Fumitoshi, Okano, Tetsuyuki
Year of Publication 03.01.2012
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Year of Publication 03.01.2012
Patent