Kelvin Probe Force Microscopy on InAs Thin Films on (110) GaAs Substrates
Takuji Takahashi, Takuji Takahashi, Takashi Kawamukai, Takashi Kawamukai, Shiano Ono, Shiano Ono, Takeshi Noda, Takeshi Noda, Hiroyuki Sakaki, Hiroyuki Sakaki
Published in Japanese Journal of Applied Physics (01.06.2000)
Published in Japanese Journal of Applied Physics (01.06.2000)
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