High-dose MeV electron irradiation of Si-SiO2 structures implanted with high doses Si
Kaschieva, S, Angelov, Ch, Dmitriev, S N
Published in Journal of physics. Conference series (01.03.2018)
Published in Journal of physics. Conference series (01.03.2018)
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Journal Article
MeV electron irradiation of Si-SiO2 structures with magnetron sputtered oxide
Kaschieva, S, Angelov, Ch, Dmitriev, S N
Published in Journal of physics. Conference series (01.03.2016)
Published in Journal of physics. Conference series (01.03.2016)
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Journal Article
Effect of MeV electron irradiation on Si-SiO2 structures
Kaschieva, S, Gushterov, A, Angelov, Ch, Dmitriev, S N
Published in Journal of physics. Conference series (01.01.2014)
Published in Journal of physics. Conference series (01.01.2014)
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Journal Article
High energy electron-beam irradiation effects in Si-SiOx structures
Nesheva, D, Dzhurkov, V, Š epanovi, M, Bineva, I, Manolov, E, Kaschieva, S, Nedev, N, Dmitriev, S N, Popovi, Z V
Published in Journal of physics. Conference series (09.02.2016)
Published in Journal of physics. Conference series (09.02.2016)
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Journal Article
Radiation defects introduced by MeV electrons in argon implanted MOS structures
Kaschieva, S., Dmitriev, S. N.
Published in Applied physics. A, Materials science & processing (01.02.2009)
Published in Applied physics. A, Materials science & processing (01.02.2009)
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Journal Article
Photoluminescence from 20 MeV electron beam irradiated homogeneous SiOx and composite Si-SiOx films
Nesheva, D, Š epanovi, M, Gruji -Broj in, M, Dzhurkov, V, Kaschieva, S, Bineva, I, Dmitriev, S N, Popovi, Z V
Published in Journal of physics. Conference series (01.10.2016)
Published in Journal of physics. Conference series (01.10.2016)
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Journal Article
Formation of Si nanocrystals in ion implanted Si-SiO2 structures by MeV electron irradiation
Kaschieva, S, Gushterov, A, Angelov, Ch, Dmitriev, S N
Published in Journal of physics. Conference series (01.01.2012)
Published in Journal of physics. Conference series (01.01.2012)
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Journal Article
Spectroscopic studies of SiOx films irradiated with high energy electrons
Dzhurkov, V, Nesheva, D, Scepanovic, M, Nedev, N, Kaschieva, S, Dmitriev, S N, Popovic, Z
Published in Journal of physics. Conference series (01.01.2014)
Published in Journal of physics. Conference series (01.01.2014)
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Journal Article
Soft X-ray emission spectroscopy of low-dimensional SiO2/Si interfaces after Si+ ion implantation and ion beam mixing
Zatsepin, D. A., Kaschieva, S., Zier, M., Schmidt, B., Fitting, H.-J.
Published in Physica status solidi. A, Applications and materials science (01.03.2010)
Published in Physica status solidi. A, Applications and materials science (01.03.2010)
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Journal Article
Interface trap generation in MOS structures by high-energy electron irradiation
Halova, E, Alexandrova, S, Kaschieva, S, Dmitriev, S N
Published in Journal of physics. Conference series (01.11.2010)
Published in Journal of physics. Conference series (01.11.2010)
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Journal Article
Si nanoclusters generated in Si-SiO2 structures implanted with different doses of Si ions
Kaschieva, S, Gushterov, A, Gushterova, P, Dmitriev, S N
Published in Journal of physics. Conference series (01.04.2010)
Published in Journal of physics. Conference series (01.04.2010)
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Journal Article
Defect formation in oxygen- and boron- implanted MOS structures after gamma irradiation
Kaschieva, S., Rebohle, L., Skorupa, W.
Published in Applied physics. A, Materials science & processing (01.03.2003)
Published in Applied physics. A, Materials science & processing (01.03.2003)
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Journal Article