Quantitative comparison using Generalized Relative Object Detectability (G-ROD) metrics of an amorphous selenium detector with high resolution Microangiographic Fluoroscopes (MAF) and standard flat panel detectors (FPD)
Russ, M, Shankar, A, Jain, A, Setlur Nagesh, S V, Ionita, C N, Scott, C, Karim, K S, Bednarek, D R, Rudin, S
Published in Proceedings of SPIE, the international society for optical engineering (27.02.2016)
Published in Proceedings of SPIE, the international society for optical engineering (27.02.2016)
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Journal Article
Probing ultrafast carrier dynamics, nonlinear absorption and refraction in core–shell silicon nanowires
KUMAR, SUNIL, KHORASANINEJAD, M, ADACHI, M M, KARIM, K S, SAINI, S S, SOOD, A K
Published in Pramāṇa (01.09.2012)
Published in Pramāṇa (01.09.2012)
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Journal Article
Raman and AFM mapping studies of photo-induced crystallization in a-Se films: substrate strain and thermal effects
Lindberg, G.P, O'Loughlin, T, Gross, N, Reznik, A, Abbaszadeh, S, Karim, K.S, Belev, G, Hunter, D.M, Weinstein, B.A
Published in Canadian journal of physics (01.07.2014)
Published in Canadian journal of physics (01.07.2014)
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Journal Article
Photo-crystallization in a-Se layer structures: Effects of film-substrate interface-rigidity
Lindberg, G. P., O'Loughlin, T., Gross, N., Mishchenko, A., Reznik, A., Abbaszadeh, S., Karim, K. S., Belev, G., Weinstein, B. A.
Published in Journal of applied physics (21.11.2014)
Published in Journal of applied physics (21.11.2014)
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Journal Article
The effect of the substrate on transient photodarkening in stabilized amorphous selenium
Abbaszadeh, S., Rom, K., Bubon, O., Weinstein, B.A., Karim, K.S., Rowlands, J.A., Reznik, A.
Published in Journal of non-crystalline solids (01.09.2012)
Published in Journal of non-crystalline solids (01.09.2012)
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Journal Article
Conference Proceeding
Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs
Karim, K.S., Nathan, A., Hack, M., Milne, W.I.
Published in IEEE electron device letters (01.04.2004)
Published in IEEE electron device letters (01.04.2004)
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Journal Article
Amorphous silicon active pixel sensor readout circuit for digital imaging
Karim, K.S., Nathan, A., Rowlands, J.A.
Published in IEEE transactions on electron devices (01.01.2003)
Published in IEEE transactions on electron devices (01.01.2003)
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Journal Article
CNN-based retrieval of x-ray phase-contrast images from experimental data
Shi, S.Q. Z., Pil-Ali, A., Meyer, S., Karim, K. S., Noel, P. B.
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
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Conference Proceeding
Fabrication of PECVD grown n-i-p silicon nanowire solar cells
Adachi, M M, Karim, K S
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
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Conference Proceeding
TlBr Films for Hard X-Ray Imaging
Squillante, M., Breen, M. J., Kargar, A., Christian, J. F., Squillante, M., Maksimov, O., Battacharya, P., Cirignano, L. J., Ogorodnik, Y., Pinaroli, G., Fuchs, M. R., Tremsin, A. S., Karim, K. S., Scott, C. C., Nagarkar, V. V.
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
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Conference Proceeding
Static characteristics of a-Si:H dual-gate TFTs
Servati, P., Karim, K.S., Nathan, A.
Published in IEEE transactions on electron devices (01.04.2003)
Published in IEEE transactions on electron devices (01.04.2003)
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Journal Article