by Frederiksen, Jorgen S, Kane, Terence J O
Published in arXiv.org (24.04.2018)

by Kane, Terence
Published in Proceedings of the 2015 International Conference on Microelectronic Test Structures (01.03.2015)

by Nogami, Takeshi, Briggs, Benjamin D., Korkmaz, Sevim, Chae, Moosung, Penny, Christopher, Juntao Li, Wei Wang, McLaughlin, Paul S., Kane, Terence, Parks, Christopher, Madan, Anita, Cohen, Stephan, Shaw, Thomas, Priyadarshini, Deepika, Shobha, Hosadurga, Son Nguyen, Patlolla, Raghuveer, Kelly, James, Xunyuan Zhang, Spooner, Terry, Canaperi, Donald, Standaert, Theodorus, Huang, Elbert, Paruchuri, Vamsi, Edelstein, Daniel
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)

by Maes, Christophe, Reul, Nicolas, Behringer, David, O’Kane, Terence
Published in Geoscience letters (31.12.2014)

by FREDERIKSEN, JORGEN S., O'KANE, TERENCE J.
Published in Journal of fluid mechanics (25.09.2005)

by Kane, William T. (William Terence)

by Kane, T., Tenney, M. P.
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01.03.2012)

by Fen Chen, Mittl, S., Shinosky, M., Swift, A., Kontra, R., Anderson, B., Aitken, J., Yanfeng Wang, Kinser, E., Kumar, M., Yun Wang, Kane, T., Feng, Kai D., Henson, W. K., Mocuta, D., Di-an Li
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)

by Christiansen, C, Baozhen Li, Angyal, M, Kane, T, McGahay, V, Yun Yu Wang, Shaoning Yao
Published in 2011 International Reliability Physics Symposium (01.04.2011)

by Christiansen, C., Baozhen Li, Angyal, M., Kane, T., McGahay, V., Yun Yu Wang, Shaoning Yao
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)

by NARASIMHA SHREESH, ONTALUS VIOREL, DEMENICUCCI ANTHONY GENE, KANE TERENCE LAWRENCE, WANG YUN YU, NUMMY KAREN A
Year of Publication 09.02.2011

by KANE TERENCE L
Year of Publication 04.02.2016

by KANE TERENCE L
Year of Publication 02.10.2014

by Kane, T
Published in 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2010)

by Dvorak, Austin Z, Smith, Justin D, Kane, Terence J
Year of Publication 12.09.2018

by WALSH JOHN M, KANE TERENCE L
Year of Publication 08.03.2016

by WALSH JOHN M, KANE TERENCE L
Year of Publication 10.12.2015

by WALSH JOHN M, KANE TERENCE L
Year of Publication 01.12.2015

by WALSH JOHN M, KANE TERENCE L
Year of Publication 11.06.2015

by STANTON MATTHEW F, KANE TERENCE L, TENNEY MICHAEL P
Year of Publication 27.10.2015