New homo-coupling reaction of alkyl, aryl, vinyl, and allyl grignard reagents using trifluoromethanesulfonic anhydride
Nishiyama, T, Seshita, T, Shodai, H, Aoki, K, Kameyama, H, Komura, K
Published in Chemistry letters (01.07.1996)
Published in Chemistry letters (01.07.1996)
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Journal Article
Emerging concerns in scaling of future semiconductor devices: Terrestrial neutron soft-error
IBE, Eishi, YAHAGI, Yasuo, KATAOKA, Fumio, ETO, Akira, HIDAKA, Mitsumori, SAITO, Yoshikazu, KAMEYAMA, Hideaki
Published in Oyo Buturi (10.11.2001)
Published in Oyo Buturi (10.11.2001)
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Journal Article
Terrestrial neutron-induced soft errors in advanced memory devices
Nakamura, Takashi, Nakamura, Takashi, Baba, Mamoru, Ibe, Eishi, Yahagi, Yasuo, Kameyama, Hideaki
Year of Publication 2008
Year of Publication 2008
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eBook
Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling
Ibe, E., Chung, S.S., ShiJie Wen, Yamaguchi, H., Yahagi, Y., Kameyama, H., Yamamoto, S., Akioka, T.
Published in IEEE Custom Integrated Circuits Conference 2006 (01.09.2006)
Published in IEEE Custom Integrated Circuits Conference 2006 (01.09.2006)
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Conference Proceeding
A Novel Feature of Neutron-Induced Multi-Cell Upsets in 130 and 180 nm SRAMs
Yahagi, Y., Yamaguchi, H., Ibe, E., Kameyama, H., Sato, M., Akioka, T., Yamamoto, S.
Published in IEEE transactions on nuclear science (01.08.2007)
Published in IEEE transactions on nuclear science (01.08.2007)
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Journal Article
A New Preparative Method of 2,2-Dimethyl-2H-chromenes
Kawase, Yoshiyuki, Yamaguchi, Seiji, Horita, Hisanori, Takeno, Junko, Kameyama, Hideaki
Published in Bulletin of the Chemical Society of Japan (01.04.1982)
Published in Bulletin of the Chemical Society of Japan (01.04.1982)
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Journal Article
Versatility of SEU function and its derivation from the irradiation tests with well-defined white neutron beams
Yahagi, Y., Ibe, E., Yamamoto, S., Yoshino, Y., Sato, M., Takahashi, Y., Kameyama, H., Saito, A., Hidaka, M.
Published in IEEE transactions on nuclear science (01.10.2005)
Published in IEEE transactions on nuclear science (01.10.2005)
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Journal Article
Self-consistent integrated system for susceptibility to terrestrial neutron induced soft-error of sub-quarter micron memory devices
Yasuo Yahagi, Saito, Y., Terunuma, K., Nunomiya, T., Nakamura, T.
Published in IEEE International Integrated Reliability Workshop Final Report, 2002 (2002)
Published in IEEE International Integrated Reliability Workshop Final Report, 2002 (2002)
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Conference Proceeding
SEALER: Novel Monte-Carlo Simulator for Single Event Effects of Composite-Materials Semiconductor Devices
Ibe, Eishi, Yahagi, Yasuo, Yamaguchi, Hironaru, Kameyama, Hideaki
Published in 2005 8th European Conference on Radiation and Its Effects on Components and Systems (01.09.2005)
Published in 2005 8th European Conference on Radiation and Its Effects on Components and Systems (01.09.2005)
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Conference Proceeding