An Efficient and Accurate DTCO Simulation Framework for Reliability and Variability-Aware Explorations of FinFETs, Nanosheets, and Beyond
Karner, Markus, Rzepa, Gerhard, Schleich, Christian, Schanovsky, Franz, Kernstock, Christian, Karner, Hui-Wen, Baumgartner, Oskar, Stanojevic, Zlatan
Published in 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (03.03.2024)
Published in 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (03.03.2024)
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