Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes
Ramesh, Saidapet, Kalyan, Rahul, Yanez, Jesse, Glowatz, Andreas, Ryynanen, Maija, Schwarz, Sergej
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
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Conference Proceeding
Defect-Directed Stress Testing Based on Inline Inspection Results
He, Chen, Grosch, Paul, Anilturk, Onder, Witowski, Joyce, Ford, Carl, Kalyan, Rahul, Robinson, John C., Price, David W., Rathert, Jay, Saville, Barry, Lee, Dave
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
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Conference Proceeding