Enhanced Biosensing Resolution with Foundry Fabricated Individually Addressable Dual-Gated ISFETs
Duarte-Guevara, Carlos, Lai, Fei-Lung, Cheng, Chun-Wen, Reddy, Bobby, Salm, Eric, Swaminathan, Vikhram, Tsui, Ying-Kit, Tuan, Hsiao Chin, Kalnitsky, Alex, Liu, Yi-Shao, Bashir, Rashid
Published in Analytical chemistry (Washington) (19.08.2014)
Published in Analytical chemistry (Washington) (19.08.2014)
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New Circuit Topology for System-Level Reliability of GaN
Lin, Ming-Cheng, Chang, Wen-Che, Wu, Haw-Yun, Lansbergen, Gabriel Petrus, Kwan, Man-Ho, Yu, Jiun-Lei, Wu, Cheng-Pao, Tsai, Chun-Lin, Tuan, Hsiao-Chin, Kalnitsky, Alex
Published in 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.05.2019)
Published in 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.05.2019)
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Conference Proceeding
Heterogeneous Power Delivery for 7nm High-Performance Chiplet-Based Processors using Integrated Passive Device and In-Package Voltage Regulator
Roth, Alan, Zhou, Charlie, Wong, Mei, Soenen, Eric, Huang, Tze-Chiang, Ranucci, Paul, Hsu, Ying-Chih, Lin, Hung-Chih, Kuo, Chester, Wang, Min-Jer, Yang, Sheng-Yao, Chu, J. R., Yeh, Ting-Yu, Ting, K. C., Loke, Alvin L. S., Rusu, Stefan, Chen, Mark, Lee, Frank Y. H., Zhang, Kevin, Kalnitsky, Alex
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
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Conference Proceeding
SEMICONDUCTOR STRUCTURE AND FABRICATING METHOD THEREOF
TUAN HSIAO CHIN, HUANG SHIH FEN, KALNITSKY ALEX, CHENG HSIN LI, TSUI FELIX YING KIT
Year of Publication 04.11.2015
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Year of Publication 04.11.2015
Patent
AlGaN/GaN MIS-HFET with improvement in high temperature gate bias stress-induced reliability
King-Yuen Wong, Lin, Y. S., Hsiung, C. W., Lansbergen, G. P., Lin, M. C., Yao, F. W., Yu, C. J., Chen, P. C., Su, R. Y., Yu, J. L., Liu, P. C., Chen, C. M., Chiang, C. H., Chiu, H. C., Liu, S. D., Lai, Y. A., Yu, C. Y., Yang, F. J., Tsai, C. L., Tsai, C. S., Chen, X., Tuan, H. C., Kalnitsky, Alex
Published in 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2014)
Published in 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2014)
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Conference Proceeding
GaN cascode performance optimization for high efficient power applications
Haw-Yun Wu, Ming-Cheng Lin, Nan-Ying Yang, Tsai, C. T., Wu, C. B., Lin, Y. S., Chang, Y. C., Chen, P. C., Wong, K. Y., Kwan, M. H., Chan, C. Y., Yao, F. W., Tsai, M. W., Yeh, C. L., Su, R. Y., Yu, J. L., Yang, F. J., Tsai, J. L., Tuan, H. C., Kalnitsky, Alex
Published in 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.06.2016)
Published in 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.06.2016)
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Improved trap-related characteristics on SiNx/AlGaN/GaN MISHEMTs with surface treatment
Yu-Syuan Lin, King-Yuen Wong, Lansbergen, G. P., Yu, J. L., Yu, C. J., Hsiung, C. W., Chiu, H. C., Liu, S. D., Chen, P. C., Yao, F. W., Su, R. Y., Chou, C. Y., Tsai, C. Y., Yang, F. J., Tsai, C. L., Tsai, C. S., Chen, X., Tuan, H. C., Kalnitsky, Alex
Published in 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2014)
Published in 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2014)
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Conference Proceeding
Fully-isolated NLDMOS behavior investigation during reverse recovery of parasitic diodes
Nan-Ying Yang, Ming-Cheng Lin, Haw-Yun Wu, Wu, C. B., Chu, L., Lu, H. T., Lee, C. Y., Jong, Y. C., Tsai, J. L., Tuan, H. C., Kalnitsky, Alex
Published in 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2015)
Published in 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2015)
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Conference Proceeding
Bulk-Si with poly bump process scheme for MEMS sensors
Chun-Wen Cheng, Kai-Chih Liang, Chia-Hua Chu, Te-Hao Lee, Jiou-Kang Lee, Chung-Hsien Lin, Hsiao Chin Tuan, Kalnitsky, A., Weileun Fang, Horsley, D. A.
Published in 2012 IEEE Sensors (01.10.2012)
Published in 2012 IEEE Sensors (01.10.2012)
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Conference Proceeding
Smart GaN platform: Performance & challenges
Chun-Lin Tsai, Yun-Hsiang Wang, Kwan, M.-H, Chen, P.-C, Yao, F.-W, Liu, S.-C, Yu, J.-L, Yeh, C.-L, Su, R.-Y, Wang, W., Yang, W.-C, Wong, K.-Y, Lin, Y.-S, Lin, M.-C, Wu, H.-Y, Chen, C.-M, Yu, C.-Y, Wu, C.-B, Chang, M.-H, You, J.-S, Huang, T.-M, Wang, S.-P, Tsai, L. Y., Chan-Hong Chern, Tuan, H. C., Kalnitsky, Alex
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
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Conference Proceeding
Magnetic thin-film inductors for monolithic integration with CMOS
Sturcken, Noah, Davies, Ryan, Hao Wu, Lekas, Michael, Shepard, Kenneth, Cheng, K. W., Chen, C. C., Su, Y. S., Tsai, C. Y., Wu, K. D., Wu, J. Y., Wang, Y. C., Liu, K. C., Hsu, C. C., Chang, C. L., Hua, W. C., Kalnitsky, Alex
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
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From sensors to intelligence
Woo, B. J., Liu, George, Cheng, Emerson, Wu, Ivan, Shih-Fen Huang, Yaung, D. N., Kalnitsky, Alex
Published in 2017 19th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS) (01.06.2017)
Published in 2017 19th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS) (01.06.2017)
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Conference Proceeding
A next generation CMOS-compatible GaN-on-Si transistors for high efficiency energy systems
Wong, K.-Y Roy, Kwan, M.-H, Yao, F.-W, Tsai, M.-W, Lin, Y.-S, Chang, Y.-C, Chen, P.-C, Su, R.-Y, Yu, J.-L, Yang, F.-J, Lansbergen, G. P., Hsiung, C.-W, Lai, Y.-A, Chiu, K.-L, Chen, C. F., Lin, M.-C, Wu, H.-Y, Chiang, C.-H, Liu, S.-D, Chiu, H.-C, Liu, P.-C, Chen, C.-M, Yu, C.-Y, Tsai, C.-S, Wu, C.-B, Lin, B., Chang, M.-H, You, J.-S, Wang, S.-P, Chen, L.-C, Liao, Y.-Y, Tsai, L. Y., Tsai, Tom, Tuan, H. C., Kalnitsky, Alex
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
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