by Kadoshima, M., Matsuki, T., Miyazaki, S., Shiraishi, K., Chikyo, T., Yamada, K., Aoyama, T., Nara, Y., Ohji, Y.
Published in IEEE electron device letters (01.05.2009)

by NABATAME, T, NUNOSHIGE, Y, KADOSHIMA, M, TAKABA, H, SEGAWA, K, KIMURA, S, SATAKE, H, OTA, H, OHISHI, T, TORIUMI, A
Published in Microelectronic engineering (01.07.2008)

by Toriumi, A., Iwamoto, K., Ota, H., Kadoshima, M., Mizubayashi, W., Nabatame, T., Ogawa, A., Tominaga, K., Horikawa, T., Satake, H.
Published in Microelectronic engineering (01.06.2005)

by NABATAME, T, SEGAWA, K, KADOSHIMA, M, TAKABA, H, IWAMOTO, K, KIMURA, S, NUNOSHIGE, Y, SATAKE, H, OHISHI, T, TORIUMI, Akira
Published in Materials science in semiconductor processing (01.12.2006)

by KADOSHIMA, Masaru, HIRATANI, Masahiko, SHIMAMOTO, Yasuhiro, TORII, Kazuyoshi, MIKI, Hiroshi, KIMURA, Shinichiro, NABATAME, Toshihide
Published in Thin solid films (31.01.2003)

by Kadoshima, M, Matsuki, T, Miyazaki, S, Shiraishi, K, Chikyo, T, Yamada, K, Aoyama, T, Nara, Y, Ohji, Y
Published in IEEE electron device letters (01.05.2009)

by Nabatame, T., Nunoshige, Y., Kadoshima, M., Takaba, H., Segawa, K., Kimura, S., Satake, H., Ota, H., Ohishi, T., Toriumi, A.
Published in Microelectronic engineering (2008)

by Hiratani, Masahiko, Kadoshima, Masaru, Hirano, Tatsumi, Shimamoto, Yasuhiro, Matsui, Yuichi, Nabatame, Toshihide, Torii, Kazuyoshi, Kimura, Shinichiro
Published in Applied surface science (28.02.2003)

by Sato, M., Umezawa, N., Mise, N., Kamiyama, S., Kadoshima, M., Morooka, T., Adachi, T., Chikyow, T., Yamabe, K., Shiraishi, K., Miyazaki, S., Uedono, A., Yamada, K., Aoyama, T., Eimori, T., Nara, Y., Ohji, Y.
Published in 2008 Symposium on VLSI Technology (01.06.2008)

by Kadoshima, M., Sugita, Y., Shiraishi, K., Watanabe, H., Ohta, A., Miyazaki, S., Nakajima, K., Chikyow, T., Yamada, K., Aminaka, T., Kurosawa, E., Matsuki, T., Aoyama, T., Nara, Y., Ohji, Y.
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)

by Inoue, M., Satoh, Y., Kadoshima, M., Sakashita, S., Kawahara, T., Anma, M., Nakagawa, R., Umeda, H., Matsuyama, S., Fujimoto, H., Miyatake, H.
Published in 2009 Symposium on VLSI Technology (01.06.2009)

by Miyazaki, Seiichi, Yoshinaga, Hiromichi, Ohta, Akio, Akasaka, Yasushi, Shiraishi, Kenji, Yamada, Keisaku, Inumiya, Seiji, Kadoshima, Masaru, Nara, Yasuo
Published in ECS transactions (09.05.2008)

by Nabatame, T., Segawa, K, Kadoshima, M., Takaba, H., Iwamoto, K., Kimura, S., Nunoshige, Y., Satake, H., Ohishi, T., Toriumi, Akira
Published in Materials science in semiconductor processing (2006)

by Ota, Hiroyuki, Ogawa, Arito, Kadoshima, Masaru, Iwamoto, Kunihiko, Okada, Kenji, Satake, Hideki, Nabatame, Toshihide, Toriumi, Akira
Published in ECS transactions (20.10.2006)

by Kadoshima, M., Matsuki, T., Mise, N., Sato, M., Hayashi, M., Aminaka, T., Kurosawa, E., Kitajima, M., Miyazaki, S., Shiraishi, K., Chikyo, T., Yamada, K., Aoyama, T., Nara, Y., Ohji, Y.
Published in 2008 Symposium on VLSI Technology (01.06.2008)

by Shiraishi, Kenji, Akasaka, Yasushi, Nakamura, Genji, Kadoshima, Masaru, Ohta, Akio, Miyazaki, Seiichi, Watanabe, Heiji, Ohmori, Kenji, Chikyow, Toyohiro, Yamabe, Kikuo, Nara, Yasuo, Ohji, Yuxuru, Yamada, Keisaku
Published in ECS transactions (28.09.2007)

by Kadoshima, Masaru, Sugita, Yoshihiro, Shiraishi, Kenji, Watanabe, Heiji, Ohta, Akio, Miyazaki, Seiichi, Nakajima, Kiyomi, Chikyow, Toyohiro, Yamada, Keisaku, Aminaka, Toshio, Kurosawa, Etsuo, Matsuki, Takeo, Aoyama, Takayuki, Nara, Yasuo, Ohji, Yuxuru
Published in ECS transactions (28.09.2007)

by Kadoshima, Masaru, Nabatame, Toshihide, Takahashi, Masashi, Ogawa, Arito, Iwamoto, Kunihiko, Mizubayashi, Wataru, Ota, Hiroyuki, Satake, Hideki, Toriumi, Akira
Published in ECS transactions (07.07.2006)

by Kadoshima, M., Ogawa, A., Ota, H., Ikeda, M., Takahashi, M., Satake, H., Nabatame, T., Toriumi, A.
Published in 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers (2006)

by Tsuda, S., Saito, T., Nagase, H., Kawashima, Y., Yoshitomi, A., Okanishi, S., Hayashi, T., Maruyama, T., Inoue, M., Muranaka, S., Kato, S., Hagiwara, T., Saito, H., Yamaguchi, T., Kadoshima, M., Mihara, T., Yanagita, H., Sonoda, K., Yamashita, T., Yamaguchi, Y.
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)