Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs
Feil, Maximilian W., Reisinger, Hans, Kabakow, Andre, Aichinger, Thomas, Gustin, Wolfgang, Grasser, Tibor
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Semiconductor device having an optical device degradation sensor
Kabakow, Andre, Aichinger, Thomas, Feil, Maximilian Wolfgang, Reisinger, Hans
Year of Publication 26.03.2024
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Year of Publication 26.03.2024
Patent
Semiconductor Device Having an Optical Device Degradation Sensor
Kabakow, Andre, Aichinger, Thomas, Feil, Maximilian Wolfgang, Reisinger, Hans
Year of Publication 20.04.2023
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Year of Publication 20.04.2023
Patent
SEMICONDUCTOR DEVICE HAVING AN OPTICAL DEVICE DEGRADATION SENSOR
AICHINGER, Thomas, KABAKOW, Andre, FEIL, Maximilian Wolfgang, REISINGER, Hans
Year of Publication 19.04.2023
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Year of Publication 19.04.2023
Patent
Electrically stimulated optical spectroscopy of interface defects in wide-bandgap field-effect transistors
Feil, Maximilian W., Reisinger, Hans, Kabakow, André, Aichinger, Thomas, Schleich, Christian, Vasilev, Aleksandr, Waldhör, Dominic, Waltl, Michael, Gustin, Wolfgang, Grasser, Tibor
Published in Communications engineering (31.01.2023)
Published in Communications engineering (31.01.2023)
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Journal Article
Time-Gated Optical Spectroscopy of Field-Effect Stimulated Recombination via Interfacial Point Defects in Fully-Processed Silicon Carbide Power MOSFETs
Feil, Maximilian W, Weger, Magdalena, Reisinger, Hans, Aichinger, Thomas, Kabakow, André, Waldhör, Dominic, Jakowetz, Andreas C, Prigann, Sven, Pobegen, Gregor, Gustin, Wolfgang, Waltl, Michael, Bockstedte, Michel, Grasser, Tibor
Published in arXiv.org (20.04.2024)
Published in arXiv.org (20.04.2024)
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Paper
Journal Article