Analysis of Contrasting Degradation Behaviors in Channel and Drift Regions Under Hot Carrier Stress in PDSOI LD N-Channel MOSFETs
Lin, Chien-Yu, Chang, Ting-Chang, Liu, Kuan-Ju, Chen, Li-Hui, Tsai, Jyun-Yu, Chen, Ching-En, Lu, Ying-Hsin, Liu, Hsi-Wen, Liao, Jih-Chien, Chang, Kuan-Chang
Published in IEEE electron device letters (01.06.2017)
Published in IEEE electron device letters (01.06.2017)
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Journal Article
Approaching Defect-free Amorphous Silicon Nitride by Plasma-assisted Atomic Beam Deposition for High Performance Gate Dielectric
Tsai, Shu-Ju, Wang, Chiang-Lun, Lee, Hung-Chun, Lin, Chun-Yeh, Chen, Jhih-Wei, Shiu, Hong-Wei, Chang, Lo-Yueh, Hsueh, Han-Ting, Chen, Hung-Ying, Tsai, Jyun-Yu, Lu, Ying-Hsin, Chang, Ting-Chang, Tu, Li-Wei, Teng, Hsisheng, Chen, Yi-Chun, Chen, Chia-Hao, Wu, Chung-Lin
Published in Scientific reports (21.06.2016)
Published in Scientific reports (21.06.2016)
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Journal Article
Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO2-Based Gate Dielectrics
Ching-En Chen, Ting-Chang Chang, Bo You, Jyun-Yu Tsai, Wen-Hung Lo, Szu-Han Ho, Kuan-Ju Liu, Ying-Hsin Lu, Xi-Wen Liu, Yu-Ju Hung, Tseung-Yuen Tseng, Osbert Cheng, Cheng-Tung Huang, Ching-Sen Lu
Published in IEEE electron device letters (01.04.2016)
Published in IEEE electron device letters (01.04.2016)
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Journal Article
Analysis of abnormal transconductance in body-tied partially-depleted silicon-on-insulator n-MOSFETs
Lin, Chien-Yu, Chang, Ting-Chang, Liu, Kuan-Ju, Chen, Li-Hui, Chen, Ching-En, Tsai, Jyun-Yu, Liu, Hsi-Wen, Lu, Ying-Hsin, Liao, Jin-Chien, Ciou, Fong-Min, Lin, Yu-Shan
Published in Thin solid films (31.12.2017)
Published in Thin solid films (31.12.2017)
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Journal Article
Impact of post-metal deposition annealing temperature on performance and reliability of high-K metal-gate n-FinFETs
Lin, Chien-Yu, Chang, Ting-Chang, Liu, Kuan-Ju, Tsai, Jyun-Yu, Chen, Ching-En, Liu, Hsi-Wen, Lu, Ying-Hsin, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung
Published in Thin solid films (01.12.2016)
Published in Thin solid films (01.12.2016)
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Journal Article
Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal–oxide–semiconductor field effect transistors
Lu, Ying-Hsin, Chang, Ting-Chang, Ho, Szu-Han, Chen, Ching-En, Tsai, Jyun-Yu, Liu, Kuan-Ju, Liu, Xi-Wen, Lin, Chien-yu, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Yen, Wei-Ting
Published in Thin solid films (01.12.2016)
Published in Thin solid films (01.12.2016)
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Journal Article
Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs
Liu, Kuan-Ju, Chang, Ting-Chang, Yang, Ren-Ya, Chen, Ching-En, Ho, Szu-Han, Tsai, Jyun-Yu, Hsieh, Tien-Yu, Cheng, Osbert, Huang, Cheng-Tung
Published in Thin solid films (01.12.2014)
Published in Thin solid films (01.12.2014)
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Journal Article
On the Origin of Anomalous Off-Current Under Hot Carrier Stress in p-Channel DDDMOS Transistors With STI Structure
Chen, Ching-En, Chang, Ting-Chang, Chen, Hua-Mao, You, Bo, Yang, Kai-Hsiang, Ho, Szu-Han, Tsai, Jyun-Yu, Liu, Kuan-Ju, Lu, Ying-Hsin, Hung, Yu-Ju, Tai, Ya-Hsiang, Tseng, Tseung-Yuen
Published in IEEE electron device letters (01.06.2014)
Published in IEEE electron device letters (01.06.2014)
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Journal Article
Impact of strain on gate-induced floating body effect for partially depleted silicon-on-insulator p-type metal–oxide–semiconductor-field-effect-transistors
Lo, Wen-Hung, Chang, Ting-Chang, Dai, Chih-Hao, Chung, Wan-Lin, Chen, Ching-En, Ho, Szu-Han, Tsai, Jyun-Yu, Chen, Hua-Mao, Liu, Guan-Ru, Cheng, Osbert, Huang, Cheng-Tung
Published in Thin solid films (15.01.2013)
Published in Thin solid films (15.01.2013)
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Journal Article
Conference Proceeding
Abnormal Transconductance Enhancement under Positive Bias Stress in Nanoscale n-Channel Fin Field-Effect-Transistors
Liu, Kuan-Ju, Chang, Ting-Chang, Lin, Chien-Yu, Chen, Ching-En, Tsai, Jyun-Yu, Lu, Ying-Hsin, Liu, Hsi-Wen, Cheng, Osbert, Huang, Cheng-Tung
Published in ECS journal of solid state science and technology (01.01.2016)
Published in ECS journal of solid state science and technology (01.01.2016)
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Journal Article
The Impact of Pre/Post-metal Deposition Annealing on Negative-Bias-Temperature Instability in HfO2 Stack p-Channel Metal-Oxide-Semiconductor Field Effect Transistors
Lu, Ying-Hsin, Chang, Ting-Chang, Ho, Szu-Han, Chen, Ching-En, Tsai, Jyun-Yu, Liu, Kuan-Ju, Liu, Xi-Wen, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Lu, Ching-Sen
Published in ECS solid state letters (16.06.2015)
Published in ECS solid state letters (16.06.2015)
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Journal Article
A Method to Determine the Located Region of Lateral Trap Position by Analysis of Three-Level Random Telegraph Signals in n-MOSFETs
Chen, Ching-En, Chang, Ting-Chang, You, Bo, Tsai, Jyun-Yu, Lo, Wen-Hung, Ho, Szu-Han, Liu, Kuan-Ju, Lu, Ying-Hsin, Hung, Yu-Ju, Tseng, Tseung-Yuen, Wu, James, Tsai, Wei-Kung, Chenge, Kuo-Yu, Syu, Yong-En
Published in ECS solid state letters (01.08.2015)
Published in ECS solid state letters (01.08.2015)
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Journal Article
Investigation of Lateral Trap Position by Random Telegraph Signal Analysis in Moderate Inversion in n-Channel MOSFETs
Chen, Ching-En, Chang, Ting-Chang, You, Bo, Lo, Wen-Hung, Ho, Szu-Han, Dai, Chih-Hao, Tsai, Jyun-Yu, Chen, Hua-Mao, Liu, Guan-Ru, Tai, Ya-Hsiang, Tseng, Tseung-Yuen
Published in ECS solid state letters (04.09.2013)
Published in ECS solid state letters (04.09.2013)
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Journal Article
Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO sub(2)-Based Gate Dielectrics
Chen, Ching-En, Chang, Ting-Chang, You, Bo, Tsai, Jyun-Yu, Lo, Wen-Hung, Ho, Szu-Han, Liu, Kuan-Ju, Lu, Ying-Hsin, Liu, Xi-Wen, Hung, Yu-Ju, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Lu, Ching-Sen
Published in IEEE electron device letters (01.04.2016)
Published in IEEE electron device letters (01.04.2016)
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Journal Article
Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO 2 -Based Gate Dielectrics
Chen, Ching-En, Chang, Ting-Chang, You, Bo, Tsai, Jyun-Yu, Lo, Wen-Hung, Ho, Szu-Han, Liu, Kuan-Ju, Lu, Ying-Hsin, Liu, Xi-Wen, Hung, Yu-Ju, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Lu, Ching-Sen
Published in IEEE electron device letters (01.04.2016)
Published in IEEE electron device letters (01.04.2016)
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Journal Article
Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with HfxZr1−xO2 and HfO2/Metal Gate Stacks
Ho, Szu-Han, Chang, Ting-Chang, Wu, Chi-Wei, Lo, Wen-Hung, Chen, Ching-En, Tsai, Jyun-Yu, Chen, Hua-Mao, Liu, Guan-Ru, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Chen, Daniel, Sze, Simon M.
Published in ECS journal of solid state science and technology (30.07.2013)
Published in ECS journal of solid state science and technology (30.07.2013)
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Journal Article
The Impact of Mechanical Strain on Reliability Issue for PD SOI MOSFETs
Lo, Wen-Hung, Chang, Ting-Chang, Dai, Chih-Hao, Chung, Wan-Lin, Tsai, Jyun-Yu, Chen, Ching-En, Cheng, Osbert, Huang, Cheng Tung
Published in ECS transactions (27.04.2012)
Published in ECS transactions (27.04.2012)
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Journal Article
Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with Hf x Zr 1−x O 2 and HfO 2 /Metal Gate Stacks
Ho, Szu-Han, Chang, Ting-Chang, Wu, Chi-Wei, Lo, Wen-Hung, Chen, Ching-En, Tsai, Jyun-Yu, Chen, Hua-Mao, Liu, Guan-Ru, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Chen, Daniel, Sze, Simon M.
Published in ECS journal of solid state science and technology (2013)
Published in ECS journal of solid state science and technology (2013)
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Journal Article
Investigation on Hot Carrier Degradation on Ti x N 1-x /HfO 2 MOSFETs
Tsai, Jyun-yu, Chang, Ting-Chang, Lo, Wen-Hung, Dai, Chih-Hao, Chen, Ching-En, Chen, Hua-Mao, Hung, Jian-ming, Cheng, Osbert, Huang, Cheng Tung
Published in Meeting abstracts (Electrochemical Society) (15.02.2012)
Published in Meeting abstracts (Electrochemical Society) (15.02.2012)
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Journal Article