A trap generation closed-form statistical model for intrinsic oxide breakdown
Huang, Huan-Tsung, Chen, Ming-Jer, Su, Chi-Wen, Chen, Jyh-Huei, Hou, Chin-Shan, Liang, Mong-Song
Published in IEEE transactions on electron devices (01.06.2001)
Published in IEEE transactions on electron devices (01.06.2001)
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