The design, analysis, and development of highly manufacturable 6-T SRAM bitcells for SoC applications
Venkatraman, R., Castagnetti, R., Kobozeva, O., Duan, F.L., Kamath, A., Sabbagh, S.T., Vilchis-Cruz, M.A., Liaw, J.J., Jyh-Cheng You, Ramesh, S.
Published in IEEE transactions on electron devices (01.02.2005)
Published in IEEE transactions on electron devices (01.02.2005)
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Journal Article
SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance
Chih-Min Fan, Shi-Chung Chang, Ruey-Shan Guo, Hui-Hung Kung, Jyh-Cheng You, Hsin-Pai Chen, Lin, S., Wei, J.
Published in 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314) (1999)
Published in 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314) (1999)
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Conference Proceeding
SHEWMAC: an end-of-line SPC scheme via exponentially weighted moving statistics
Chih-Min Fan, Shi-Chung Chang, Ruey-Shan Guo, Hui-Hung Kung, Jyh-Cheng You, Hsin-Pai Chen, Lin, S., Chih-Shih Wei
Published in 2000 Semiconductor Manufacturing Technology Workshop (Cat. No.00EX406) (2000)
Published in 2000 Semiconductor Manufacturing Technology Workshop (Cat. No.00EX406) (2000)
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Conference Proceeding