Loading…
Optical and microstructural properties of electrodeposited cuprous oxide
Jurečka, Stanislav, Sahoo, Prangya P., Čendula, Peter
Published in Applied physics. A, Materials science & processing (01.03.2024)
Published in Applied physics. A, Materials science & processing (01.03.2024)
Get full text
Journal Article
Loading…
Forming of porous silicon layers for PV applications
Get full text
Journal Article
Conference Proceeding
Loading…
Loading…
Multifractal and optical bandgap characterization of Ta2O5 thin films deposited by electron gun method
Shakoury, Reza, Rezaee, Sahar, Mwema, Fredrick, Luna, Carlos, Ghosh, Koushik, Jurečka, Stanislav, Ţălu, Ştefan, Arman, Ali, Grayeli Korpi, Alireza
Published in Optical and quantum electronics (01.02.2020)
Published in Optical and quantum electronics (01.02.2020)
Get full text
Journal Article
Loading…
Influence of film thickness on structural, optical, and electrical properties of sputtered nickel oxide thin films
Rezaee, Sahar, Korpi, Alireza Grayeli, Karimi, Maryam, Jurečka, Stanislav, Arman, Ali, Luna, Carlos, Ţălu, Ştefan
Published in Microscopy research and technique (01.07.2024)
Published in Microscopy research and technique (01.07.2024)
Get full text
Journal Article
Loading…
Multifractal analysis and optical properties of nanostructured silicon layers
Jurečka, Stanislav, Matsumoto, Taketoshi, Imamura, Kentaro, Kobayashi, Hikaru
Published in Applied surface science (15.02.2017)
Published in Applied surface science (15.02.2017)
Get full text
Journal Article
Loading…
Loading…
Investigation of deposition temperature effect on spatial patterns of MgF2 thin films
Shakoury, Reza, Matos, Robert Saraiva, Fonseca Filho, Henrique Duarte, Rezaee, Sahar, Arman, Ali, Boochani, Arash, Jurečka, Stanislav, Zelati, Amir, Mardani, Mohsen, Ţălu, Ştefan
Published in Microscopy research and technique (01.02.2023)
Published in Microscopy research and technique (01.02.2023)
Get full text
Journal Article
Loading…
Loading…
Minkowski functional characterization and fractal analysis of surfaces of titanium nitride films
Grayeli Korpi, Alireza, lu, tefan, Bramowicz, Miros aw, Arman, Ali, Kulesza, S awomir, Pszczolkowski, Bartosz, Jure ka, Stanislav, Mardani, Mohsen, Luna, Carlos, Balashabadi, Parvin, Rezaee, Sahar, Gopikishan, Sabavath
Published in Materials research express (12.06.2019)
Published in Materials research express (12.06.2019)
Get full text
Journal Article
Loading…
Properties of nanostructured layers formed on silicon
Jurečka, Stanislav, Matsumoto, Taketoshi, Imamura, Kentaro, Kobayashi, Hikaru
Published in AIP conference proceedings (01.08.2018)
Published in AIP conference proceedings (01.08.2018)
Get full text
Journal Article
Conference Proceeding
Loading…
Multifractal analysis of textured silicon surfaces
Jurečka, Stanislav, Angermann, Heike, Kobayashi, Hikaru, Takahashi, Masao, Pinčík, Emil
Published in Applied surface science (15.05.2014)
Published in Applied surface science (15.05.2014)
Get full text
Journal Article
Conference Proceeding
Loading…
Microstructure and optical properties of layers formed by anodic etching of silicon
Jurečka, Stanislav, Králik, Martin, Pinčík, Emil
Published in AIP conference proceedings (29.07.2019)
Published in AIP conference proceedings (29.07.2019)
Get full text
Journal Article
Conference Proceeding
Loading…
Determination of thickness of electrochemically etched Si layers passivated by Si3N4 by analysis of the experimental spectral reflectance
Králik, Martin, Jurečka, Stanislav, Pinčík, Emil
Published in AIP conference proceedings (29.07.2019)
Published in AIP conference proceedings (29.07.2019)
Get full text
Journal Article
Conference Proceeding
Loading…
Black silicon – correlation between microstructure and Raman scattering
Jurečka, Stanislav, Pinčík, Emil, Imamura, Kentaro, Matsumoto, Taketoshi, Kobayashi, Hikaru
Published in Journal of Electrical Engineering (01.12.2019)
Published in Journal of Electrical Engineering (01.12.2019)
Get full text
Journal Article
Loading…
Microstructure, fractal geometry and corrosion properties of CrN thin films: The effect of shot number and angular position
Habibi, Maryam, Mirzaei, Saeed, Arman, Ali, Jurečka, Stanislav, Sadeghi, Mohammad, Zelati, Amir, Shakoury, Reza, Tanhaee, Ehsan, Ghobadi, Nader, Ehteram, Hamid, Ţălu, Ştefan
Published in Materials today communications (01.08.2022)
Published in Materials today communications (01.08.2022)
Get full text
Journal Article
Loading…
Loading…
Properties of nanocrystalline Si layers embedded in structure of solar cell
Jurečka, Stanislav, Imamura, Kentaro, Matsumoto, Taketoshi, Kobayashi, Hikaru
Published in Journal of Electrical Engineering (01.12.2017)
Published in Journal of Electrical Engineering (01.12.2017)
Get full text
Journal Article
Loading…
Reflectance analysis of porosity gradient in nanostructured silicon layers
Jurečka, Stanislav, Imamura, Kentaro, Matsumoto, Taketoshi, Kobayashi, Hikaru
Year of Publication 01.12.2017
Year of Publication 01.12.2017
Get full text
Conference Proceeding
Loading…
Microstructure and optical properties of black silicon layers
Jurečka, Stanislav, Králik, Martin, Pinčík, Emil, Imamura, Kentaro, Matsumoto, Taketoshi, Kobayashi, Hikaru
Year of Publication 18.12.2018
Year of Publication 18.12.2018
Get full text
Conference Proceeding