On-Wafer FinFET-Based 3-D E-Beam Detector Cube for In Situ Monitoring of Advanced Lithography Processes Beyond 5 nm
Teng, Yu-Jie, Chao, Ho-Ting, Chang, Wei, Jeng Lin, Burn, Chih, Yue-Der, Chang, Jonathan, Jung Lin, Chrong, King, Ya-Chin
Published in IEEE transactions on electron devices (01.06.2024)
Published in IEEE transactions on electron devices (01.06.2024)
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Journal Article
Embedded 1-Mb ReRAM-Based Computing-in- Memory Macro With Multibit Input and Weight for CNN-Based AI Edge Processors
Xue, Cheng-Xin, Chang, Ting-Wei, Chang, Tung-Cheng, Kao, Hui-Yao, Chiu, Yen-Cheng, Lee, Chun-Ying, King, Ya-Chin, Lin, Chrong-Jung, Liu, Ren-Shuo, Hsieh, Chih-Cheng, Tang, Kea-Tiong, Chen, Wei-Hao, Chang, Meng-Fan, Liu, Je-Syu, Li, Jia-Fang, Lin, Wei-Yu, Lin, Wei-En, Wang, Jing-Hong, Wei, Wei-Chen, Huang, Tsung-Yuan
Published in IEEE journal of solid-state circuits (01.01.2020)
Published in IEEE journal of solid-state circuits (01.01.2020)
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Journal Article
3-D Stackable Offset-Via Antifuse by Cu BEOL Process in Advanced CMOS Technologies
Yeh, Li-Yu, Chang, Ya-Lin, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong-Jung, King, Ya-Chin
Published in IEEE transactions on electron devices (01.12.2023)
Published in IEEE transactions on electron devices (01.12.2023)
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Journal Article
Multilevel Fully Logic-Compatible Latch Array for Computing-in-Memory
Yeh, Ming-Shyue, Wang, Ya-Ching, Huang, Yao-Hung, Shih, Jiaw-Ren, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong-Jung, King, Ya-Chin
Published in IEEE transactions on electron devices (01.04.2023)
Published in IEEE transactions on electron devices (01.04.2023)
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Journal Article
A Contact-Resistive Random-Access-Memory-Based True Random Number Generator
HUANG, Chien-Yuan, WEN CHAO SHEN, TSENG, Yuan-Heng, KING, Ya-Chin, LIN, Chrong-Jung
Published in IEEE electron device letters (01.08.2012)
Published in IEEE electron device letters (01.08.2012)
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Journal Article
Test Pattern Design for Plasma Induced Damage on Inter-Metal Dielectric in FinFET Cu BEOL Processes
Su, Chi, Tsai, Yi-Pei, Lin, Chrong-Jung, King, Ya-Chin
Published in Nanoscale research letters (01.05.2020)
Published in Nanoscale research letters (01.05.2020)
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Journal Article
High-density via RRAM cell with multi-level setting by current compliance circuits
Hsieh, Yu-Cheng, Lin, Yu-Cheng, Huang, Yao-Hung, Chih, Yu-Der, Chang, Jonathan, Lin, Chrong-Jung, King, Ya-Chin
Published in Discover nano (25.03.2024)
Published in Discover nano (25.03.2024)
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Journal Article
Self-Convergent Trimming SRAM True Random Number Generation With In-Cell Storage
Yeh, Po-Shao, Yang, Chih-An, Chang, Yi-Hong, Chih, Yue-Der, Lin, Chrong-Jung, King, Ya-Chin
Published in IEEE journal of solid-state circuits (01.09.2019)
Published in IEEE journal of solid-state circuits (01.09.2019)
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Journal Article
Wide range detector of plasma induced charging effect for advanced CMOS BEOL processes
Chao, Yi-Jie, Yang, Kai-Wei, Su, Chi, Lin, Chrong-Jung, King, Ya-Chin
Published in Nanoscale research letters (03.07.2021)
Published in Nanoscale research letters (03.07.2021)
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Journal Article
Antifuse OTP Cell in a Cross-Point Array by Advanced CMOS FinFET Process
Kuo, Ren-Jay, Chang, Fu-Cheng, King, Ya-Chin, Lin, Chrong-Jung
Published in IEEE transactions on electron devices (01.04.2019)
Published in IEEE transactions on electron devices (01.04.2019)
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Journal Article
Advanced self-convergent calibration for selenized two-dimensional film gas sensors
Liu, Che-Chuan, Shen, Hsin-Yi, Wang, Kuangye, Chueh, Yu-Lun, Chih, Yue-Der, Chang, Jonathan, Shih, Jiaw-Ren, Lin, Chrong-Jung, King, Ya-Chin
Published in Japanese Journal of Applied Physics (29.02.2024)
Published in Japanese Journal of Applied Physics (29.02.2024)
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Journal Article
Application of twin-bit self-rectifying via RRAM with unique diode state in cross-bar arrays by advanced CMOS Cu BEOL process
Lin, Yu-Cheng, Huang, Yao-Hung, Chuang, Kai-Ching, Chih, Yu-Der, Chang, Jonathan, Lin, Chrong-Jung, King, Ya-Chin
Published in Japanese Journal of Applied Physics (29.02.2024)
Published in Japanese Journal of Applied Physics (29.02.2024)
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Journal Article
A ReRAM-Based Nonvolatile Flip-Flop With Self-Write-Termination Scheme for Frequent-OFF Fast-Wake-Up Nonvolatile Processors
Lee, Albert, Chieh-Pu Lo, Chien-Chen Lin, Wei-Hao Chen, Kuo-Hsiang Hsu, Zhibo Wang, Fang Su, Zhe Yuan, Qi Wei, Ya-Chin King, Chrong-Jung Lin, Hochul Lee, Amiri, Pedram Khalili, Kang-Lung Wang, Yu Wang, Huazhong Yang, Yongpan Liu, Meng-Fan Chang
Published in IEEE journal of solid-state circuits (01.08.2017)
Published in IEEE journal of solid-state circuits (01.08.2017)
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Journal Article
Embedded Micro-detectors for EUV Exposure Control in FinFET CMOS Technology
Wang, Chien-Ping, Lin, Burn Jeng, Wu, Pin-Jiun, Shih, Jiaw-Ren, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong Jung, King, Ya-Chin
Published in Nanoscale research letters (05.01.2022)
Published in Nanoscale research letters (05.01.2022)
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Journal Article
A ReRAM Macro Using Dynamic Trip-Point-Mismatch Sampling Current-Mode Sense Amplifier and Low-DC Voltage-Mode Write-Termination Scheme Against Resistance and Write-Delay Variation
Lo, Chieh-Pu, Lin, Wen-Zhang, Lin, Wei-Yu, Lin, Huan-Ting, Yang, Tzu-Hsien, Chiang, Yen-Ning, King, Ya-Chin, Lin, Chrong-Jung, Chih, Yu-Der, Chang, Tsung-Yung Jonathon, Chang, Meng-Fan
Published in IEEE journal of solid-state circuits (01.02.2019)
Published in IEEE journal of solid-state circuits (01.02.2019)
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Journal Article
Detectors Array for In Situ Electron Beam Imaging by 16-nm FinFET CMOS Technology
Wang, Chien-Ping, Lin, Burn Jeng, Shih, Jiaw-Ren, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong Jung, King, Ya-Chin
Published in Nanoscale research letters (25.05.2021)
Published in Nanoscale research letters (25.05.2021)
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Journal Article
Dynamic pH Sensor with Embedded Calibration Scheme by Advanced CMOS FinFET Technology
Wang, Chien-Ping, Shen, Ying-Chun, Liou, Peng-Chun, Chueh, Yu-Lun, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong-Jung, King, Ya-Chin
Published in Sensors (Basel, Switzerland) (02.04.2019)
Published in Sensors (Basel, Switzerland) (02.04.2019)
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Journal Article
Embedded Near-Infrared Sensor With Tunable Sensitivity for Nanoscale CMOS Technologies
Chen, Zih-Hong, Huang, Po-Hsiang, Wang, Chein-Ping, Chih, Yu-Der, Lin, Chrong-Jung, King, Ya-Chin
Published in IEEE sensors journal (01.02.2019)
Published in IEEE sensors journal (01.02.2019)
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