Crack nucleation during mechanical fatigue in thin metal films on flexible substrates
Kim, Byoung-Joon, Shin, Hae-A-Seul, Jung, Sung-Yup, Cho, Yigil, Kraft, Oliver, Choi, In-Suk, Joo, Young-Chang
Published in Acta materialia (01.05.2013)
Published in Acta materialia (01.05.2013)
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Journal Article
Effects of Metal Electrode on the Electrical Performance of Amorphous In–Ga–Zn–O Thin Film Transistor
Yim, Jung-Ryoul, Jung, Sung-Yup, Yeon, Han-Wool, Kwon, Jang-Yoen, Lee, Young-Joo, Lee, Je-Hun, Joo, Young-Chang
Published in Japanese Journal of Applied Physics (01.01.2012)
Published in Japanese Journal of Applied Physics (01.01.2012)
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Journal Article
Bias polarity and frequency effects of Cu-induced dielectric breakdown in damascene Cu interconnects
Jung, Sung-Yup, Kim, Byoung-Joon, Lee, Nam Yeal, Kim, Baek-Mann, Yeom, Seung Jin, Kwak, Noh Jung, Joo, Young-Chang
Published in Microelectronic engineering (2012)
Published in Microelectronic engineering (2012)
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Journal Article
Conference Proceeding
Effects of film thickness and deposition rate on the diffusion barrier performance of titanium nitride in Cu-through silicon vias
Lee, Young-Joo, Yeon, Han-Wool, Jung, Sung-Yup, Na, Se-Kwon, Park, Jong-Seung, Choi, Yong-Yoon, Lee, Hoo-Jeong, Song, Oh-Sung, Joo, Young-Chang
Published in Electronic materials letters (2014)
Published in Electronic materials letters (2014)
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Journal Article
Usefulness of 18 F-FDG PET/CT to Detect Metastatic Mucinous Adenocarcinoma Within an Inguinal Hernia
Seo, Hyo Jung, Min, Byung Wook, Eo, Jae Seon, Lee, Sun Il, Kang, Sang Hee, Jung, Sung Yup, Oh, Sang Chul, Choe, Jae Gol
Published in Nuclear medicine and molecular imaging (2016)
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Published in Nuclear medicine and molecular imaging (2016)
Journal Article
The characteristics of Cu-drift induced dielectric breakdown under alternating polarity bias temperature stress
Sung-Yup Jung, Byoung-Joon Kim, Nam Yeal Lee, Baek-Mann Kim, Seung Jin Yeom, Noh Jung Kwak, Young-Chang Joo
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Study of Cu Migration-Induced Failure of Inter-Layer Dielectric
Sang-Soo Hwang, Sung-Yup Jung, Jung-Kyu Jung, Young-Chang Joo
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)
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Conference Proceeding
SEMICONDUCTOR DEVICES
NA SANG CHEOL, CHO YOUNG WOO, LEE DONG ICK, PARK KI CHUL, JUNG SUNG YUP
Year of Publication 09.03.2023
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Year of Publication 09.03.2023
Patent
Erratum: "Effects of Metal Electrode on the Electrical Performance of Amorphous In--Ga--Zn--O Thin Film Transistor"
Yim, Jung-Ryoul, Jung, Sung-Yup, Yeon, Han-Wool, Kwon, Jang-Yoen, Lee, Young-Joo, Lee, Je-Hun, Joo, Young-Chang
Published in Japanese Journal of Applied Physics (01.02.2012)
Published in Japanese Journal of Applied Physics (01.02.2012)
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Journal Article
Erratum: “Effects of Metal Electrode on the Electrical Performance of Amorphous In–Ga–Zn–O Thin Film Transistor”
Yim, Jung-Ryoul, Jung, Sung-Yup, Yeon, Han-Wool, Kwon, Jang-Yoen, Lee, Young-Joo, Lee, Je-Hun, Joo, Young-Chang
Published in Japanese Journal of Applied Physics (01.02.2012)
Published in Japanese Journal of Applied Physics (01.02.2012)
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Journal Article
Effects of Metal Electrode on the Electrical Performance of Amorphous In–Ga–Zn–O Thin Film Transistor
Yim, Jung-Ryoul, Jung, Sung-Yup, Yeon, Han-Wool, Kwon, Jang-Yoen, Lee, Young-Joo, Lee, Je-Hun, Joo, Young-Chang
Published in Japanese Journal of Applied Physics (01.01.2012)
Published in Japanese Journal of Applied Physics (01.01.2012)
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Journal Article