Observation of broad triangular Frank-type stacking faults and characterization of stacking faults with emission wavelengths below 430 nm in 4H–SiC epitaxial layers
Na, Moonkyong, Bahng, Wook, Jung, Hyundon, Oh, Chanhyoung, Jang, Donghyun, Hong, Soon-Ku
Published in Applied physics letters (08.04.2024)
Published in Applied physics letters (08.04.2024)
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Journal Article
Revisiting stacking fault identification based on the characteristic photoluminescence emission wavelengths of silicon carbide epitaxial wafers
Na, Moonkyong, Bahng, Wook, Jung, Hyundon, Oh, Chanhyoung, Jang, Donghyun, Hong, Soon-Ku
Published in Materials science in semiconductor processing (01.06.2024)
Published in Materials science in semiconductor processing (01.06.2024)
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Journal Article
Photoluminescence and electroluminescence properties of GaN-based LED chips with defective regions at low excitation levels
Jongseok Kim, Seungtaek Kim, HyungTae Kim, Sung Bok Kang, Hoon Jeong, Hyundon Jung
Published in 2017 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR) (01.07.2017)
Published in 2017 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR) (01.07.2017)
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Conference Proceeding
Investigations on correlation between photoluminescence images of an LED epi-wafer and characteristics of LED chips
Jongseok Kim, HyungTae Kim, Seungtaek Kim, Hoon Jeong, In-Sung Cho, Min Soo Noh, Hyundon Jung
Published in 2015 11th Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR) (01.08.2015)
Published in 2015 11th Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR) (01.08.2015)
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Conference Proceeding
Modified Diode Equations for Light-Emitting Diodes Considering Radiative and Nonradiative Currents
Shin, Dong-Soo, Shim, Jong-In, Lee, Sang-Geun, Jung, Hyundon
Published in 2019 34th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) (01.06.2019)
Published in 2019 34th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) (01.06.2019)
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Conference Proceeding