Analysis of Drain-Induced Barrier Lowering for Gate-All-Around FET with Ferroelectric
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Published in International journal of engineering and technology innovation (27.03.2024)
Published in International journal of engineering and technology innovation (27.03.2024)
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Growth and characterization of indium tin oxide thin films deposited on PET substrates
Lee, Jaehyeong, Jung, Hakkee, Lee, Jongin, Lim, Donggun, Yang, Keajoon, Yi, Junsin, Song, Woo-Chang
Published in Thin solid films (15.02.2008)
Published in Thin solid films (15.02.2008)
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Conference Proceeding