Characterization and Raman investigations on high-quality ZnO thin films fabricated by reactive electron beam evaporation technique
Al Asmar, R., Atanas, J.P., Ajaka, M., Zaatar, Y., Ferblantier, G., Sauvajol, J.L., Jabbour, J., Juillaget, S., Foucaran, A.
Published in Journal of crystal growth (01.06.2005)
Published in Journal of crystal growth (01.06.2005)
Get full text
Journal Article