by Pradeep, Krishna, Scheer, Patrick, Poiroux, Thierry, Juge, André, Ghibaudo, Gérard
Published in Semiconductor science and technology (01.05.2020)

by Pradeep, Krishna, Poiroux, Thierry, Scheer, Patrick, Juge, André, Ghibaudo, Gérard
Published in Solid-state electronics (01.01.2020)

by Pradeep, Krishna, Poiroux, Thierry, Scheer, Patrick, Juge, André, Gouget, Gilles, Ghibaudo, Gérard
Published in Solid-state electronics (01.07.2018)

by El Ghouli, Salim, Sallese, Jean-Michel, Juge, Andre, Scheer, Patrick, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2019)

by Martinie, Sebastien, Rozeau, Olivier, Kolev, Plamen, Scheer, Patrick, Ghouli, Salim El, Juge, Andre, Lee, Harrison, Poiroux, Thierry
Published in 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2021)

by Pradeep, Krishna, Gouget, Gilles, Poiroux, Thierry, Scheer, Patrick, Juge, Andre, Ghibaudo, Gerard
Published in 2017 International Conference of Microelectronic Test Structures (ICMTS) (01.03.2017)

by Xingsheng Wang, Roy, G., Saxod, O., Bajolet, A., Juge, A., Asenov, A.
Published in IEEE electron device letters (01.05.2012)

by El Ghouli, Salim, Rideau, Denis, Monsieur, Frederic, Scheer, Patrick, Gouget, Gilles, Juge, André, Poiroux, Thierry, Sallese, Jean-Michel, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2018)

by Poiroux, Thierry, Rozeau, O., Scheer, Patrick, Martinie, Sebastien, Jaud, Marie-Anne, Minondo, M., Juge, Andre, Barbe, J. C., Vinet, Maud
Published in IEEE transactions on electron devices (01.09.2015)

by Pradeep, Krishna, Poiroux, Thierry, Scheer, Patrick, Gouget, Gilles, Juge, Andre, Ghibaudo, Gerard
Published in 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (01.04.2017)

by Ghouli, Salim El, Grabinski, Wladyslaw, Sallese, Jean Michel, Juge, Andre, Lallement, Christophe
Published in 2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES) (01.06.2018)

by El Ghouli, Salim, Scheer, Patrick, Minondo, Michel, Juge, Andre, Poiroux, Thierry, Sallese, Jean Michel, Lallement, Christophe
Published in 2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems (01.06.2016)

by Valentin, R., Bertrand, G., Puget, S., Scheer, P., Juge, A., Jaouen, H., Raynaud, C.
Published in IEEE transactions on electron devices (01.11.2011)

by Rideau, D., Uhring, W., Bianchi, R. A., Helleboid, R., Mugny, G., Grebot, J., Manouvrier, J.R., Neri, R., Brun, F., Lakeh, M. Dolatpoor, Rink, S., Kammerer, J-B., Lallement, C., Lacombe, E., Golanski, D., Rae, B., Bah, T. M., Twaddle, F., Quenette, V., Marchand, G., Buj, C., Fillon, R., Henrion, Y., Nicholson, I., Agnew, M., Basset, M., Perrier, R., Al-Rawhani, M., Mamdy, B., Pellegrin, S., Gouget, G., Maciazek, P., Juge, A., Dartigues, A., Alause, H. Wehbe
Published in ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (11.09.2023)

by Castaneda, G., Juge, A., Ghibaudo, G., Golanski, D., Hoguet, D., Portal, J., Borot, B.
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01.03.2012)

by Paz, Bruna Cardoso, Cassé, Mikaël, Haendler, Sebastien, Juge, Andre, Vincent, Emmanuel, Galy, Philippe, Arnaud, Franck, Ghibaudo, Gérard, Vinet, Maud, de Franceschi, Silvano, Meunier, Tristan, Gaillard, Fred
Published in Solid-state electronics (01.12.2021)

by Berlingard, Quentin, Lugo-Alvarez, Jose, Contamin, Lauriane, Durand, Cédric, Galy, Philippe, Juge, Andre, De Franceschi, Silvano, Vinet, Maud, Meunier, Tristan, Cassé, Mikaël, Gaillard, Fred
Published in Solid-state electronics (01.08.2022)

by El Ghouli, Salim, Rideau, Denis, Monsieur, Frederic, Scheer, Patrick, Gouget, Gilles, Juge, Andre, Poiroux, Thierry, Sallese, Jean-Michel, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2018)

by Contamin, Lauriane, Casse, Mikael, Garros, Xavier, Gaillard, Fred, Vinet, Maud, Galy, Philippe, Juge, Andre, Vincent, Emmanuel, de Franceschi, Silvano, Meunier, Tristan
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)

by Martinie, Sebastien, Rozeau, Olivier, Poiroux, Thierry, Scheer, Patrick, Ghouli, Salim El, Kang, Mihyun, Juge, Andre, Lee, Harrison
Published in 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (23.09.2020)