Improvement of sensing margin and reset switching fail of RRAM
Park, Woo Young, Ju, Wonki, Ko, Young Seok, Kim, Soo Gil, Ha, Tae Jung, Lee, Jae Yeon, Park, Yong Taek, Kim, Kyung Wan, Lee, Jong Chul, Lee, Jong Ho, Moon, Joo Young, Lee, Bo Mi, Gyun, Byung Gu, Lee, Byoung-Ki, Kim, Jin Kook
Published in Solid-state electronics (01.06.2019)
Published in Solid-state electronics (01.06.2019)
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