Search Results - "Journal of semiconductor technology and science" :: K.UTB vyhledávací portál

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A 28 Gb/s Receiver Front-end Capable of Receiving Wide Range Current Signal in 65 nm CMOS

by Koh, Daehyun, Jeong, Daniel, Hwang, Jeongho, Jeong, Deog-Kyoon
Published in Journal of semiconductor technology and science (01.12.2022)

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A Novel PWAM Signaling Scheme for High-speed Serial Interface

by Kim, HwanUng, Kang, Jin-Ku
Published in Journal of semiconductor technology and science (31.10.2022)

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Extension of DRAM Retention Time at 77 Kelvin by Replacing Weak Rows with Large GIDL Current

by Kim, Ho-Jun, Lee, Won-Cheol, Park, Hong-June
Published in Journal of semiconductor technology and science (01.06.2022)

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Time-domain Continuous-time Delta-sigma Modulator using VCO-based Integrator and GRO-based Quantizer

by Lee, Eunsang, Han, Jaeduk
Published in Journal of semiconductor technology and science (01.08.2022)

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An Optoelectronic Transimpedance Amplifier in 180-nm CMOS for Short-range LiDAR Sensors

by Hu, Yu, Joo, Ji-Eun, Lee, Myung-Jae, Park, Sung-Min
Published in Journal of semiconductor technology and science (01.08.2022)

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Investigation of p-type High Temperature Field Effect Transistor for CMOS Logic Application

by Jeong, Tae-Woong, Oh, Yun-Jae, Chun, Seo-Yeon, Kim, Dae Hwan, Lee, Woojoo, Cho, Il-Hwan
Published in Journal of semiconductor technology and science (01.10.2022)

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Sub-6 GHz Noise-cancelling Balun-LNTA with Dual-band Q-enhanced LC Notch Filter for 5G New Radio Cellular Applications

by Lee, Donggu, Kwon, Kuduck
Published in Journal of semiconductor technology and science (30.06.2022)

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Novel Process Technologies of a Deep-submicron MOSFET for the High Packing Density of Circuits

by Cho, Eou-Sik, Kwon, Sang-Jik
Published in Journal of semiconductor technology and science (01.12.2021)

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Fabrication and Performances of Recessed Gate AlGaN/GaN MOSFETs with Si₃N₄/TiO₂ Stacked Dual Gate Dielectric

by An, Hee-Dae, Bae, Jin-Hyuk, Lee, Sin-Hyung, Kang, In-Man, Min, So-Ra, Lee, Sang-Ho, Park, Jin, Kim, Geon-Uk, Yoon, Young-Jun, Seo, Jae-Hwa, Cho, Min-Su, Jang, Jaewon
Published in Journal of semiconductor technology and science (01.04.2022)

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Prediction Methodology for Next-generation Device Characteristics using Machine Learning

by Gil, Gwangnae, Woo, Sola
Published in Journal of semiconductor technology and science (01.04.2022)

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Implementation and Performance Analysis of Elliptic Curve Cryptography using an Efficient Multiplier

by Renita J, Edna Elizabeth N, Nandhini Asokan
Published in Journal of semiconductor technology and science (01.04.2022)

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High Resolution CMOS Frequency-to-digital Converter for a Fine Dust Sensor using a MEMS Resonator

by Moon, Hyunwon
Published in Journal of semiconductor technology and science (01.06.2022)

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A Compact 6-bit Phase Shifter in 65 nm RF CMOS Technology for ISM Band

by Ngo, Tan-Binh, Do, Quang-Huy, Yoon, Sang-Woong
Published in Journal of semiconductor technology and science (01.06.2022)

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Nanoelectromechanical (NEM) Devices for Logic and Memory Applications

by Kwon, Hyug-Su, Choi, Woo-Young
Published in Journal of semiconductor technology and science (01.06.2022)

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A Study on SRAM Designs to Exploit the TEI-aware Ultra-low Power Techniques

by Lee, Seung-Yeong, Lee, Jae-Hyoung, Lee, Woojoo, Kim, Younghyun
Published in Journal of semiconductor technology and science (01.06.2022)

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An 80 dB Second-order Noise Shaping SAR ADC using Differential Integral Capacitors and Comparator with Voltage Gain Calibration

by Jung, Hoyong, Jeon, Neungin, Cheon, Jimin, Jang, Young-Chan
Published in Journal of semiconductor technology and science (01.08.2022)

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A Novel Architecture of Asynchronous Sorting Engine Module for ASIC Design

by Yoon, Myungchul
Published in Journal of semiconductor technology and science (01.08.2022)

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Research of Quantized Current Effect with Work Function Variation in Tunnel-field Effect Transistor

by Lee, Kang, Kim, Sangwan, Kim, Garam, Kim, Jang-Hyun
Published in Journal of semiconductor technology and science (01.08.2022)

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Quantification of Substrate Current Caused by an Individual Trap at Different Locations and Energies, Prevailing on Si/SiO₂ Interface or Si Substrate of n-MOSFETs

by Shahzadi, Nosheen, Baeg, Sanghyeon
Published in Journal of semiconductor technology and science (01.08.2022)

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Impact of Dielectrics in SOI FinFET for Lower Power Consumption in Punch-through Current-based Local Thermal Annealing

by Cha, Dong-Woo, Park, Jun-Young
Published in Journal of semiconductor technology and science (01.06.2021)

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