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Advances in ion beam micromachining for complex 3D microfluidics
Ocola, Leonidas E., Palacios, Edgar
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.11.2013)
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.11.2013)
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Ferroelectric phenomena in Si-doped HfO2 thin films with TiN and Ir electrodes
Lomenzo, Patrick D., Zhao, Peng, Takmeel, Qanit, Moghaddam, Saeed, Nishida, Toshikazu, Nelson, Matthew, Fancher, Chris M., Grimley, Everett D., Sang, Xiahan, LeBeau, James M., Jones, Jacob L.
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.05.2014)
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.05.2014)
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Hydrogen sensing characteristics and mechanism of Pd∕AlGaN∕GaN Schottky diodes subjected to oxygen gettering
Hasegawa, Hideki, Akazawa, Masamichi
Published in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena (01.07.2007)
Published in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena (01.07.2007)
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Subsurface damage from helium ions as a function of dose, beam energy, and dose rate
Livengood, Richard, Tan, Shida, Greenzweig, Yuval, Notte, John, McVey, Shawn
Published in Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena (01.11.2009)
Published in Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena (01.11.2009)
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Nanocolumnar growth of thin films deposited at oblique angles: Beyond the tangent rule
Alvarez, Rafael, Lopez-Santos, Carmen, Parra-Barranco, Julian, Rico, Victor, Barranco, Angel, Cotrino, Jose, Gonzalez-Elipe, Agustin R., Palmero, Alberto
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.07.2014)
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.07.2014)
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Plasma enhanced layer-by-layer deposition and nanocrystallization of hydrogenated amorphous silicon films
Chen, Zhuo, Mucha, John A., Donnelly, Vincent M., Economou, Demetre J.
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.11.2013)
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.11.2013)
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Visualizing graphene edges using tip-enhanced Raman spectroscopy
Su, Weitao, Roy, Debdulal
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.07.2013)
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.07.2013)
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Realization of ultrashallow junctions by plasma immersion ion implantation and laser annealing
Vervisch, V., Etienne, H., Torregrosa, F., Roux, L., Ottaviani, L., Pasquinelli, M., Sarnet, T., Delaporte, P.
Published in Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures (01.01.2008)
Published in Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures (01.01.2008)
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Selectivity of metal oxide atomic layer deposition on hydrogen terminated and oxidized Si(001)-(2×1) surface
Longo, Roberto C., McDonnell, Stephen, Dick, D., Wallace, R. M., Chabal, Yves J., Owen, James H. G., Ballard, Josh B., Randall, John N., Cho, Kyeongjae
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.05.2014)
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.05.2014)
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Fabrication of thin-film silicon on insulator by separation by implanted oxygen layer transfer
Wei, Xing, Wu, Ai Min, Chen, Meng, Chen, Jing, Zhang, Miao, Wang, Xi, Lin, Cheng Lu
Published in Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena (01.11.2008)
Published in Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena (01.11.2008)
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Time-resolved and excitation-dependent photoluminescence study of CdTe/MgCdTe double heterostructures grown by molecular beam epitaxy
Zhao, Xin-Hao, DiNezza, Michael J., Liu, Shi, Lin, Su, Zhao, Yuan, Zhang, Yong-Hang
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.07.2014)
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.07.2014)
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Effect of cantilever deformation and tip-sample contact area on AFM nanoscratching
Geng, Yanquan, Yan, Yongda, Xing, Yangming, Zhang, Qi, Zhao, Xuesen, Hu, Zhenjiang
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.11.2013)
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.11.2013)
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Talbot lithography: Self-imaging of complex structures
Isoyan, A., Jiang, F., Cheng, Y. C., Cerrina, F., Wachulak, P., Urbanski, L., Rocca, J., Menoni, C., Marconi, M.
Published in Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena (01.11.2009)
Published in Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena (01.11.2009)
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Level-set-based inverse lithography for mask synthesis using the conjugate gradient and an optimal time step
Lv, Wen, Liu, Shiyuan, Xia, Qi, Wu, Xiaofei, Shen, Yijiang, Lam, Edmund Y.
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.07.2013)
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.07.2013)
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Etch properties of resists modified by sequential infiltration synthesis
Tseng, Yu-Chih, Peng, Qing, Ocola, Leonidas E., Czaplewski, David A., Elam, Jeffrey W., Darling, Seth B.
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.11.2011)
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.11.2011)
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