Thin films stress extraction using micromachined structures and wafer curvature measurements
Laconte, J., Iker, F., Jorez, S., André, N., Proost, J., Pardoen, T., Flandre, D., Raskin, J.-P.
Published in Microelectronic engineering (01.10.2004)
Published in Microelectronic engineering (01.10.2004)
Get full text
Journal Article
Conference Proceeding
Low-cost optical instrumentation for thermal characterization of MEMS
Jorez, S, Laconte, J, Cornet, A, Raskin, J-P
Published in Measurement science & technology (01.09.2005)
Published in Measurement science & technology (01.09.2005)
Get full text
Journal Article
Temperature variation mapping of a microelectromechanical system by thermoreflectance imaging
Grauby, S., Dilhaire, S., Jorez, S., Claeys, W.
Published in IEEE electron device letters (01.02.2005)
Published in IEEE electron device letters (01.02.2005)
Get full text
Journal Article
Strain energy imaging of a power MOS transistor using speckle interferometry
Dilhaire, S., Grauby, S., Jorez, S., Claeys, W.
Published in IEEE transactions on reliability (01.06.2004)
Published in IEEE transactions on reliability (01.06.2004)
Get full text
Journal Article
Optical method for the measurement of the thermomechanical behaviour of electronic devices
Dilhaire, S., Jorez, S., Cornet, A., Schaub, E., Claeys, W.
Published in Microelectronics and reliability (01.06.1999)
Published in Microelectronics and reliability (01.06.1999)
Get full text
Journal Article
Measurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging technique
Grauby, Stéphane, Dilhaire, Stefan, Jorez, Sébastien, Lopez, Luis David Patino, Rampnoux, Jean-Michel, Claeys, Wilfrid
Published in Applied optics (2004) (01.04.2003)
Published in Applied optics (2004) (01.04.2003)
Get more information
Journal Article
Laser diode COFD analysis by thermoreflectance microscopy
Dilhaire, Stefan, Grauby, Stéphane, Jorez, Sébastien, Patino Lopez, Luis-David, Schaub, Emmanuel, Claeys, Wilfrid
Published in Microelectronics and reliability (01.09.2001)
Published in Microelectronics and reliability (01.09.2001)
Get full text
Journal Article
Fault localisation in ICs by goniometric laser probing of thermal induced surface waves
Dilhaire, S., Altet, J., Jorez, S., Schaub, E., Rubio, A., Claeys, W.
Published in Microelectronics and reliability (01.06.1999)
Published in Microelectronics and reliability (01.06.1999)
Get full text
Journal Article
Measurement of the thermomechanical strain of electronic devices by shearography
Dilhaire, S., Jorez, S., Cornet, A., Patiño Lopez, L.D., Claeys, W.
Published in Microelectronics and reliability (01.08.2000)
Published in Microelectronics and reliability (01.08.2000)
Get full text
Journal Article
Strain imaging in thermoelectric devices by laser probe shearography
Jorez, S., Dilhaire, S., Lopez, L.P., Granby, S., Claeys, W., Uemura, K., Stockholm, J.G.
Published in Proceedings ICT2001. 20 International Conference on Thermoelectrics (Cat. No.01TH8589) (2001)
Published in Proceedings ICT2001. 20 International Conference on Thermoelectrics (Cat. No.01TH8589) (2001)
Get full text
Conference Proceeding
Study of the thermal behaviour of PN thermoelectric couples by laser probe interferometric measurement
Patino-Lopez, L.D., Dilhaire, S., Grauby, S., Jorez, S., Claeys, W., Uemura, K., Stockholm, J.G.
Published in Proceedings ICT2001. 20 International Conference on Thermoelectrics (Cat. No.01TH8589) (2001)
Published in Proceedings ICT2001. 20 International Conference on Thermoelectrics (Cat. No.01TH8589) (2001)
Get full text
Conference Proceeding
Laser probes for the thermal and thermomechanical characterisation of microelectronic devices
Claeys, Wilfrid, Dilhaire, Stefan, Jorez, Sébastien, Patiño-Lopez, Luis-David
Published in Microelectronics (01.10.2001)
Published in Microelectronics (01.10.2001)
Get full text
Journal Article
Thermal study of PN thermoelectric couple by laser induced Seebeck EMF measurement
Patiño-Lopez, Luis-David, Amine Salhi, M., Dilhaire, Stefan, Grauby, Stéphane, Rampnoux, Jean-Michel, Jorez, Sébastien, Claeys, Wilfrid
Published in Superlattices and microstructures (01.03.2004)
Published in Superlattices and microstructures (01.03.2004)
Get full text
Journal Article
Laser diode light efficiency determination by thermoreflectance microscopy
Dilhaire, Stefan, Jorez, Sebastien, Patiño-Lopez, Luis-David, Claeys, Wilfrid, Schaub, Emmanuel
Published in Microelectronics (01.10.2001)
Published in Microelectronics (01.10.2001)
Get full text
Journal Article
Determination of ZT of PN thermoelectric couples by AC electrical measurement
Dilhaire, S., Patino-Lopez, L.-D., Grauby, S., Rampnoux, J.-M., Jorez, S., Claeys, W.
Published in Twenty-First International Conference on Thermoelectrics, 2002. Proceedings ICT '02 (2002)
Published in Twenty-First International Conference on Thermoelectrics, 2002. Proceedings ICT '02 (2002)
Get full text
Conference Proceeding