The effect of medial open wedge high tibial osteotomy on the patellofemoral joint: comparative analysis according to the preexisting cartilage status
Moon, Hyun-Soo, Choi, Chong-Hyuk, Jung, Min, Park, Sang-Hoon, Lee, Dae-Young, Shin, Jong-Kwan, Kim, Sung-Hwan
Published in BMC musculoskeletal disorders (14.12.2019)
Published in BMC musculoskeletal disorders (14.12.2019)
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Journal Article
Decrease of Parasitic Capacitance for Improvement of RF Performance of Multi-finger MOSFETs in 90-nm CMOS Technology
Jang, Seong-Yong, Kwon, Sung-Kyu, Shin, Jong-Kwan, Yu, Jae-Nam, Oh, Sun-Ho, Jeong, Jin-Woong, Song, Hyeong-Sub, Kim, Choul-Young, Lee, Ga-Won, Lee, Hi-Deok
Published in Journal of semiconductor technology and science (01.04.2015)
Published in Journal of semiconductor technology and science (01.04.2015)
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Journal Article
Dependence of the 1/f Noise Characteristics of CMOSFETs on Body Bias in Sub-threshold and Strong Inversion Regions
Kwon, Sung-Kyu, Kwon, Hyuk-Min, Kwak, Ho-Young, Jang, Jae-Hyung, Shin, Jong-Kwan, Hwang, Seon-Man, Sung, Seung-Yong, Lee, Ga-Won, Lee, Song-Jae, Han, In-Shik, Chung, Yi-Sun, Lee, Jung-Hwan, Lee, Hi-Deok
Published in Journal of semiconductor technology and science (01.12.2013)
Published in Journal of semiconductor technology and science (01.12.2013)
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Journal Article
Architecture of the Triceps Surae Muscles Complex in Patients with Spastic Hemiplegia: Implication for the Limited Utility of the Silfverskiöld Test
Park, Kun-Bo, Joo, Sun Young, Park, Hoon, Rhee, Isaac, Shin, Jong-Kwan, Abdel-Baki, Sharkawy Wagih, Kim, Hyun Woo
Published in Journal of clinical medicine (01.12.2019)
Published in Journal of clinical medicine (01.12.2019)
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Journal Article
A novel BJT structure for high- performance analog circuit applications
Seon-Man Hwang, Hyuk-Min Kwon, Jae-Hyung Jang, Ho-Young Kwak, Sung-Kyu Kwon, Seung-Yong Sung, Jong-Kwan Shin, Jae-Nam Yu, In-Shik Han, Yi-Sun Chung, Jung-Hwan Lee, Ga-Won Lee, Hi-Deok Lee
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
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