Investigation of Hot Carrier Degradation Modes in LDMOS by using a Novel Three-Region Charge Pumping Technique
Cheng, C.C., Tu, K.C., Tahui Wang, Hsieh, T.S., Tzeng, J.T., Jong, Y.C., Liou, R.S., Pan, S.C., Hsu, S.L.
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.01.2006)
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.01.2006)
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Conference Proceeding
Physics and Characterization of Various Hot-Carrier Degradation Modes in LDMOS by Using a Three-Region Charge-Pumping Technique
Chih-Chang Cheng, Lin, J.F., Tahui Wang, Hsieh, T.H., Tzeng, J.T., Jong, Y.C., Liou, R.S., Pan, S.C., Hsu, S.L.
Published in IEEE transactions on device and materials reliability (01.09.2006)
Published in IEEE transactions on device and materials reliability (01.09.2006)
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Magazine Article
Impact of Self-Heating Effect on Hot Carrier Degradation in High-Voltage LDMOS
Chih-Chang Cheng, Lin, J.F., Tahui Wang
Published in 2007 IEEE International Electron Devices Meeting (01.01.2007)
Published in 2007 IEEE International Electron Devices Meeting (01.01.2007)
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Conference Proceeding