by Xingguo Xiong, Yu-Liang Wu, Jone, W.-B.
Published in IEEE transactions on instrumentation and measurement (01.10.2005)

by Das, S.R., Hossain, A., Biswas, S., Petriu, E.M., Assaf, M.H., Jone, W.-B., Sahinoglu, M.
Published in IEEE transactions on instrumentation and measurement (01.10.2008)

by Wei Pei, Jone, W.-B., Yiming Hu
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.2007)

by Jianxun Liu, Jone, W.-B., Das, S.R.
Published in IEEE transactions on instrumentation and measurement (01.08.2006)

by Das, S.R., Ramamoorthy, C.V., Assaf, M.H., Petriu, E.M., Jone, W.-B., Sahinoglu, M.
Published in IEEE transactions on instrumentation and measurement (01.12.2005)

by Das, S.R., Ramamoorthy, C.V., Assaf, M.H., Petriu, E.M., Jone, W.-B., Sahinoglu, M.
Published in IEEE transactions on instrumentation and measurement (01.10.2005)

by Narayanan, V., Ghosh, S., Jone, W.-B., Das, S.R.
Published in IEEE transactions on instrumentation and measurement (01.10.2005)

by Das, S.R., Sudarma, M., Assaf, M.H., Petriu, E.M., Jone, W.-B., Chakrabarty, K., Sahinoglu, M.
Published in IEEE transactions on instrumentation and measurement (01.10.2003)

by Jone, W.-B., Der-Chen Huang, Das, S.R.
Published in IEEE transactions on instrumentation and measurement (01.10.2003)

by Jiang, J.H., Jone, W.-B., Shih-Chieh Chang, Ghosh, S.
Published in IEEE transactions on reliability (01.12.2003)

by Chen, J.Y., Jone, W.B., Wang, J.S., Lu, H.-I., Chen, T.F.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.03.1999)

by Jone, W.B., Huang, D.C., Wu, S.C., Lee, K.J.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.08.2002)

by Huang, D.C., Jone, W.B.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.05.2002)

by Das, S.R., Zakizadeh, J., Biswas, S., Assaf, M.H., Nayak, A.R., Petriu, E.M., Jone, W.-B., Sahinoglu, M.
Published in IEEE transactions on instrumentation and measurement (01.06.2007)

by Arora, V., Jone, W.B., Huang, D.C., Das, S.R.
Published in IEEE transactions on instrumentation and measurement (01.08.2004)

by Ghosh, S., Lai, K.W., Jone, W.B., Chang, S.C.
Published in 13th Asian Test Symposium (2004)

by Cheng, C.H., Jone, W.B., Chang, S.C., Wang, J.S.
Published in Electronics letters (28.09.2000)

by Jone, W. B., Huang, D. C., Chang, S. C., Das, S. R.
Published in VLSI Design (01.01.2001)

by Jone, W.-B., Madden, P.H.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.1993)

by Huang, D.C., Jone, W.B.
Published in Proceedings - Asian Test Symposium (2000)