Mission Reliability, Cost and Time for Cold Standby Computing Systems with Periodic Backup
Levitin, Gregory, Xing, Liudong, Johnson, Barry W., Dai, Yuanshun
Published in IEEE transactions on computers (01.04.2015)
Published in IEEE transactions on computers (01.04.2015)
Get full text
Journal Article
A battery state-of-charge indicator for electric wheelchairs
Aylor, J.H., Thieme, A., Johnso, B.W.
Published in IEEE transactions on industrial electronics (1982) (01.10.1992)
Published in IEEE transactions on industrial electronics (1982) (01.10.1992)
Get full text
Journal Article
Optimization of dynamic spot-checking for collusion tolerance in grid computing
Levitin, Gregory, Xing, Liudong, Johnson, Barry W., Dai, Yuanshun
Published in Future generation computer systems (01.09.2018)
Published in Future generation computer systems (01.09.2018)
Get full text
Journal Article
A comparison of two safety-critical architectures using the safety related metrics
Yangyang Yu, Johnson, B.W.
Published in Annual Symposium Reliability and Maintainability, 2004 - RAMS (2004)
Published in Annual Symposium Reliability and Maintainability, 2004 - RAMS (2004)
Get full text
Conference Proceeding
Safety-critical systems built with COTS
Profeta, J.A., Andrianos, N.P., Bing Yu, Johnson, B.W., DeLong, T.A., Guaspart, D., Jamsck, D.
Published in Computer (Long Beach, Calif.) (01.11.1996)
Published in Computer (Long Beach, Calif.) (01.11.1996)
Get full text
Journal Article
Object-oriented techniques in hardware design
Kumar, S., Aylor, J.H., Johnson, B.W., Wulf, W.A.
Published in Computer (Long Beach, Calif.) (01.06.1994)
Published in Computer (Long Beach, Calif.) (01.06.1994)
Get full text
Journal Article
Modeling of common-mode failures in digital embedded systems
Kaufman, L.M., Bhide, S., Johnson, B.W.
Published in Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) (2000)
Published in Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) (2000)
Get full text
Conference Proceeding
A variance-reduction technique via fault-expansion for fault-coverage estimation
Smith, D.T., Johnson, B.W., Andrianos, N., Profeta, J.A.
Published in IEEE transactions on reliability (01.09.1997)
Published in IEEE transactions on reliability (01.09.1997)
Get full text
Journal Article
Using statistics of the extremes for software reliability analysis of safety critical systems
Kaufman, L.M., Dugan, J.B., Johnson, B.W.
Published in Proceedings - International Symposium on Software Reliability Engineering (1998)
Published in Proceedings - International Symposium on Software Reliability Engineering (1998)
Get full text
Conference Proceeding
Journal Article